Hi

I have a rather strange question - is there a way to tell layout XL to NOT place the error/warning markers on a design when I open a cell?  I do a lot of my layout by using arrays from placed instances and create mosaics that completely ignore the metadata that Layout XL uses with its bindings with schematic (and instances get deleted etc. but I do like using it to generate all my pins etc.) and it's just really annoying when I open a design that I know is LVS clean and since the connectivity metadata is all screwed up (because I did not use it to actually complete the layout) I have a design that's just blinking at me at every gate, source and drain.  I typically delete them at the high level heirarchically but the second I go in and modify something and come back up it places all of them again.  I know that if I flatten all the p cells it goes away but sometimes it's nice to have that piece of metadata but that's about it.  Is there a way to "break" the features of XL like this?  I realize what a weird question this is but it's becoming more of an issue since we moved to IC 23 from IC 6 where there is no longer a layout L that I can use free from these annoyances that can't use any of the connectivity metadata.

Thanks

Chris

Hello everyone,

I hope you're all doing well. I’ve set up two testbenches (TB1 and TB2) for my Design Under Test (DUT) using Cadence IC6.1.8-64b.500.21 tools, as shown in the attached figure. The DUT has multiple views available: schematic, Calibre, Maestro, and Symbol, and each testbench uses the same DUT in different scenarios. Currently, I have to manually switch between these views, but I would like to streamline this process.

My goal is to use a single config view that allows me to switch between the schematic and the extracted (Calibre) views. Ideally, I would like to have a configuration file where making changes once would update both testbenches (TB1 and TB2) automatically. In other words, when I modify one config, both testbenches should reflect this update for a single simulation run.

I would really appreciate it if you could guide me on the following:

1. How to create a config view for my DUT that can be used to easily switch between the schematic and extracted views, impacting both TB1 and TB2.
2. Where to specify view priorities or other settings to control which view is used during simulation.
3. Best practices for using a config file in this scenario, so that it ensures consistency across multiple testbenches.

Please refer to the attached figure to get a better understanding of the setup I’m using, where both TB1 and TB2 include the same DUT with multiple available views.

Thank you so much for your time and assistance!

I want to use jaspergold to formally verify functionality of my custom multiplier. I am computing the expected result using A*B to check against output of my multiplier. Here, A and B are two logic signed operands. However, jaspergold is performing the operation A*B incorrectly.

I have reproduced this issue using the attached example. JasperGold compiles and elaborates the module and subsequently runs a formal proof. The tool raises a counterexample to assertion whose screenshot is attached below:

I simulated the same example using xrun and it was giving the correct product output in simvision waveform. Please help me resolve this issue. I am using 2023.03 version of Jasper Apps.

Thanks and regards

Anubhav Agarwal

I'm completely new to Cadence. I've been able to run a very simple simulation with the -gui option. Simvision opens, I add the variables to the waveform viewer, and press run. All is good.

I don't understand the flow when using the -nogui option. It appears that the simulation runs and returns control to the OS. When I launch Simvision, is there a database or file that I can open to display the already-simulated data?

My command is of the form:

xrun -gui -64bit -sv -access +rwc -top tb_top.sv <src files>

I would like to send an update about a vmanager regression status x days after the regression has been run. In the current environment, the vmanager regression is creating a new filepath for logs automatically based on regression name/date, so I can't use a cron job to gather logs, as the log location is not known. 

I tried to use the pre session script to launch a detached shell script that would run after a delay, but when the pre_script runs, it waits until everything is completed before finishing and moving on to starting the regression.

Here is the test pre_script I am using:

#!/bin/sh

echo "pre_script start"

delay_script "FIRST" 1
nohup delay_script "SECOND" 30 & disown
delay_script "THIRD" 1

echo "pre_script end"
exit 0

Here is the test delay_script I am using:

#!/bin/sh

echo "Starting $1"

sleep $2

echo "Ending $1"

Here is the script output when run from terminal. After the "pre_script end", I get control back.

Here is the script output when run from vmanager. There is no "nohup", and the pre_session phase doesn't complete until all the delay scripts complete.

My question is, is there a better way to achieve my goal here? (The goal being to run a script from the vmanager log directory automatically x days after the regression). I think I could use the pre_script to send directory information for an auxiliary cron job to pick up, but I would prefer to not have to have extra cronjobs needed for this.

I'm working on the code coverage. Doing a metrics analysis by default we see overall average grade and overall covered. But when i do a block analysis on an instance i see overall covered grade, code covered grade, block covered grade, statement covered grade, expression covered grade, toggle covered grade.

As I dont know the difference I started to read the IMC user guide and came to know there are 3 things we come across while doing a code coverage local, covered, average

From my understanding

local - child instances metrics doesnt reach the parent level. For example, we have an instance Q and its sub instances like Q.a, Q.b. Block Local grade of Q can be 100% even when its instances Q.a and Q.b a block local grades isnt at 100%.

In the attached image there is formula 

The key difference between average and covered is the weights.

Average : Mathematically taking the above scenario where Q.a, and Q.b has 10 blocks each. Q.a has covered 8 blocks and q.b has covered 2 blocks. Now if we take the normal average it should be total covered/ totatl number = 8+2/10+10 yielding 50%. But when we add weights saying Q.a is 70% and Q.b is 30% the new number would be (8*0.7+2*0.3) / (10*0.7+10*0.3) resulting 62%. Because of the weights we see 12% bump.

Covered: there is no role of weights.

Among these 3 metrics i've changed my default view to this in the image to get more realistic picture when i do analyze metrics. Do you guys agree with the approach?

First time user of JasperGold. Chip level verif. I want to prove that an arbiter and a buffer are connected. I want to use the connectivity app to do that.

I see from the user guide, that I should provide a connectivity map, but i have no idea how to construct one.
The training videos said use this command: check_conn -generate_template jasper_template.xlsm -xlsm
But that did nothing, or at least it did not produce a file that i could find

[<embedded>] % check_conn -generate_template jasper_template.xlsm -xlsm
ERROR (ESW104): Invalid command formation.
Problem occurs with "-generate_template -xlsm".

And even if it did, I don't even know what's in the file, and whether it contains the two ips I'm trying to check.

I'm hoping someone can give me a bit of a boost here with some knowledge.

Hello,

I have a question about toggle coverage.

In my case, there are many unused registers or wires that are affecting the toggle coverage score negatively.

Is it possible to automatically exclude registers or wires that are not used from toggle coverage?

My RTL code is as follows, Is it possible to automatically disable tb.top1.b and tb.top1.c without using an exclude file?

module top1;

  reg a;

  reg b;

  reg [31:0] c;

  initial

  begin

  #1 a=1'b0;

  #1 a=1'b1;

  #1 a=1'b0;

  end

endmodule

module tb;

  top1 top1();

endmodule

We are trying to run compilation, elab and sim with command xrun -r -u alu, where alu is one of the units to execute. we are getting the following errors.

1) xmsim: *E,DLMKDF: Unable to add default DEFINE std       /home/xxxx/Cad/xcelium/tools/inca/files/STD.
    xmsim: *E,DLMKDF: Unable to add default DEFINE synopsys  /home/xxxx/Cad/xcelium/tools/inca/files/SYNOPSYS

2) xmsim: *W,DLNOHV: Unable to find an 'hdl.var' file to load in.

What is the purpose of hdl.var

3) xmsim: *F,NOSNAP: Snapshot 'alu' does not exist in the libraries.

I cannot see in log files, which libraries is it referring to??

Any one request you to help on how to debug these.

Hello All,

starting with version 8.1 the contents of the ce_tools directory will no longer
be shipped with Specman. The directory contains some unsupported AE/R&D
ware and has not been updated for several releases (i.e. most of those old
packages don't work with the latest release).
 
Attached is the contents of this directory. Please read the README before
using any of the packages.


Regards,
-hannes

Hi, I am uploading a register class, which can be used for modeling hardware registers. I am uploading the source code and examples on how to run it. I also have a user guide which has all the APIs listed and explained. The user guide is ARV.pdf in the attached tar file. I have named the class ARV, which stands for Architect's Register View. It has got very good randomization and coverage features. Users have told me that its better than RAL. You can download it from http://verisilica.info/ARV.php
. There is a limit of 750KB in this cadence website. The ARV file is 4MB. That is why, I am uploading it at this site. I have a big pdf documentation and a doxygen documentation there. That is the reason for the bigger file size. The password to open the ZIP file is ovm_arv. I hope, everyone will use these classes.

Please contact me for any help.
Regards ANil

Hi All.

I put together a small Perl script to generate vr_ad register definitions from SPIRIT (IP-XACT) XML.
If you've got not idea what IP-XACT is, have a look here www.spiritconsortium.org/, then start pestering your design manager to use it :-)

The script can filter out registers and override R/W access types if needed.

An example XML file is included with the package so that you can play with it, and there's a detailed README.txt as well.

Here's an example of the generated e code:

// Automatically generated from xdmac.xml
// DO NOT EDIT, or your changes may be lost
<'

import vr_ad/e/vr_ad_top;

// Component = XDMAC
// memoryMap = xdmac
extend vr_ad_map_kind : [XDMAC];

// addressBlock = dma_eth
extend vr_ad_reg_file_kind : [DMA_ETH];

extend DMA_ETH vr_ad_reg_file {
  keep size == 20;
  keep addressing_width_in_bytes == 4;
};

// Register = command
// Reset    = 0x00
reg_def COMMAND DMA_ETH 0x0 {
  // Field resv3 = command[31:29]
  reg_fld resv3 : uint(bits:3) : R : 0 : cov ;
  // Field transfer_size = command[28:19]
  reg_fld transfer_size : uint(bits:10) : RW : 0 : cov ;
  // Field dma_transfer_target = command[18:14]
  reg_fld dma_transfer_target : uint(bits:5) : RW : 0 : cov ;
  // Field resv2 = command[13:10]
  reg_fld resv2 : uint(bits:4) : R : 0 : cov ;
  // Field transmit_receive = command[9:9]
  reg_fld transmit_receive : uint(bits:1) : RW : 0 : cov ;
  // Field resv1 = command[8:5]
  reg_fld resv1 : uint(bits:4) : R : 0 : cov ;
  // Field dest_address_enable = command[4:4]
  reg_fld dest_address_enable : uint(bits:1) : RW : 0 : cov ;
  // Field source_address_enable = command[3:3]
  reg_fld source_address_enable : uint(bits:1) : RW : 0 : cov ;
  // Field word_size = command[2:0]
  reg_fld word_size : uint(bits:3) : R : 0 : cov ;
};

// Register = queue_exec
// Reset    = 0x00
reg_def QUEUE_EXEC DMA_ETH 0x10 {
  // Field resv = queue_exec[31:1]
  reg_fld resv : uint(bits:31) : R : 0 : cov ;
  // Field exec = queue_exec[0:0]
  reg_fld exec : uint(bits:1) : RW : 0 : cov ;
};

extend XDMAC vr_ad_map {
  dma_eth : DMA_ETH vr_ad_reg_file;

  post_generate() is also {
    add_with_offset(0x00, dma_eth);
    dma_eth.reset();
  };
}
'>

Any comments, please feed them back to me so I can enhance the script.
Note that this forum forces me to post a .zip file rather than .tgz, please be careful to unpack the file under Linux, not Windows, else the DOS linefeeds will corrupt the Perl and XML files.

Steve

Hello,

I have a question I want to create a cover that consists a sparse values, pre-computed (a list or define) for example l = {1; 4; 7; 9; 2048; 700} I'd like to cover that data a (uint(bits:16)) had those values, Any suggestion on how to achieve this, I'd prefer to stay away from macros, and avoid to write a lot of code

struct inst {

  data :uint(bits:16);
  opcode :uint(bits:16);
  !valid_data : list of uint(bits:16) = {0; 12; 10; 700; 890; 293;};
  event data_e;
  event opcode_e;

  cover data_e is {
     item data using radix = HEX, ranges = {
     //I dont want to write all of this
     range([0], "My range1");
     range([10], "My range2");
     //... many values in between
    range([700], "My rangen");
    };

    item opcode;

   cross data, opcode;
};

post_generate() is also {
    emit data_e;
};
};

Modified version of shr_ram from erm_lib to support mvl_values
regards: snaptube

Join this insightful on-demand webinar event "SI/PI Simulation and Measurement Correlation Forum" available through Signal Integrity Journal that features industry expert presentations ranging from chip to package to complex board designs.(read more)

Using the EMX solver, X-FAB design engineers can efficiently develop next-generation RF technology for the latest communication standards (including sub-6GHz 5G, mmWave, UWB, etc.), which are enabling technologies for communications and electric vehicle (EV) wireless applications. (read more)

The Sigrity and Systems Analysis (SIGRITY/SYSANLS) 2022.1 HF2 release is now available for download at Cadence Downloads. For the list of CCRs fixed in the 2022.1 HF2 release, see the README.txt file in the installation hierarchy.(read more)

The silkscreen layer plays a crucial role in the assembly, repair, and testing of a PCB. You can add a variety of information to this layer, such as the location of the components, polarity, component orientation, on-off switches, LEDs, and testpoint...(read more)

Hi, I would be grateful if you can help me with this error which I get after trying to run an EMX simulation on a PCELL.

I've found very limited information in this forum. Thanks

Hi,

My Virtuoso and Spectre Version: ICADVM20.1-64b.NYISR30.2

I have an expression where the EvalType is "sweeps". Here is the expression (I also attached the snapshot):

(peakToPeak(leafValue(swapSweep(delay(?wf1 clip((VT("/clk0") - VT("/clk180")) (VAR("mt_stop") - (4.0 / VAR("datarate"))) VAR("mt_stop")) ?value1 0 ?edge1 "rising" ?nth1 1 ?td1 0 ?tol1 nil ?wf2 clip((VT("/tx_padp") - VT("/tx_padn")) (VAR("mt_stop") - (4.0 / VAR("datarate"))) VAR("mt_stop")) ?value2 0 ?edge2 "rising" ?nth2 1 ?tol2 nil ?td2 nil ?stop nil ?multiple nil) "VDD_FIXED_NOISE") "VREGLN_cmode" 0.85 "VREGDRV_novn" 0.4 "datarate" 1.658e+10) ?overall t) / 10.0)

What this expression does is that it compares the delay between the output data with respect to a reference clock. I then get this information for two conditions (VDD_FIXED_NOISE = 0 or 10mV) to get the effect of the supply-induced jitter. In the expression, I need to give the value of each parameter in different modes to distinguish them from each other. Now I want to sweep the base supply values and see the supply variation effects. For example, I want to change VREGLN_cmode from 0.85 to 0.81 and see how my supply-induced jitter changes. For that, the hard way is to copy the expression and change that value accordingly (e.g. "VREGLN_cmode" 0.81). I'm looking for an easier way to use a variable in the expression. Something like VAR("VREGLN_Sweep"). But I see it doesn't work in my expression and it gives an eVal error. I tested this before in other expressions (not sweep type) and it always worked. I have only one test and these variables are all Design Variables and not Global variables.
I want to know what mistake am I doing here and is there a way to make this work. Sorry that if I could not explain better my inquiry. Thank you.

Hi,

In our design team, we're looking for a strategy to make all cell views self-contained. We are struggling to do so when nport devices are involved.

The nport file requires a full path, whereas what we need is a relative path to the current path of the cell in which we're using the nport.

I have browsed through the forums & cadence support pages, but could not find a solution.

1) There is a proposal from Andrew to add the file directory in ADE option "Simulation Files." :https://community.cadence.com/cadence_technology_forums/f/rf-design/27167/s-parameter-datafile-path-in-nport . This, however, is not suitable, because the cell is not self contained.

2) The new cadence version off DataSource "cellView" in nport options:

This however is not suitable for us due to two reasons:

i- Somehow we don't get this option in the nport cell (perhaps some custom modification from our PDK team)

ii- Even if we had this option, it requires to select the library, which again makes it unsuitable: We often copy design libraries for derivative products using "Hierarchical Copy" feature. And when the library is copied, the nport will still be pointing to the old library. Thus, it is still not self-contained.

In principle, it should not be difficult (technically) to point to a text file relative to the cell directory (f.ex we can make a folder under the same cell with name "sparFiles" & place all spar files under this folder), however it does not seem to be possible.

Could you perhaps recommend us a work-around to achieve our goal: making the cells which contain nport devices self-contained so that when we copy a cell, we do not have to update all the nport file destinations ?

Thanks in advance.

My Cadence Version: IC23.1-64b.ISR4.51

My Spectre version: 23.1.0.362.isr5

I want to plot the inductance through formula L1=(imag(Z(1,1))/(2*pi*freq)), but the system tells me that the freq is unbound variable? What can I do?

Hi *,

I am simulating a 32kHz high Q crystal oscillator with a pulse shaping circuit. I set up a PSS analysis using the Shooting Newton engine. I set a beat frequency of 32k and used the crystal output and ground as reference nodes. After the initial transient the amplitude growth was already pretty much settled such that the shooting iterations could continue the job.

My problem is: In 5...10% of my PVT runs the simulator detects a frequency divider in the initial transient simulation. The output log says:

Frequency divided by 3 at node <xxx>

The Estimated oscillating frequency from Tstab Tran is = 11.0193 kHz .

However, the mentioned node is only part of the control logic and is always constant (but it has some ripples and glitches which are all less than 30uV). These glitches spoil my fundamental frequency (11kHz instead of 32kHz). Sometimes the simulator detects a frequency division by 2 or 3 and the mentioned node <xxx> is different depending on PVT - but the node is always a genuine high or low signal inside my control logic.

How can I tell the simulator that there is no frequency divider and it should only observe the given node pair in the PSS analysis setup to estimate the fundamental frequency? I have tried the following workarounds but none of them worked reliably:

- extended/reduced the initial transient simulation time

- decreased accuracy

- preset override with Euler integration method for the initial transient to damp glitches

- tried different initial conditions

- specified various oscillator nodes in the analysis setup form

By the way, I am using Spectre X (version 21.1.0.389.ISR8) with CX accuracy.

Thanks for your support and best regards

Stephan

I get multiple results at the same frequency in a 3-tone simulation.

I try to determine the IP3 of a mixer. I have 3 large signal tones: 0.75 GHz, 1.25 GHz and 1.26 GHz.

At the IM3 frequency of 490 MHz I observe 4 results, see also the screenshot of the table output. The frequencies are exactly the same (even when I subtract 490 MHz by using xval() ).

Which of the values do I have to use to determine the correct IP3?

Is there an option to merge these results?

While adding an element created from a netlist file in AWR, I am getting the error 'The element type being dropped is not compatible with the window it is being dropped into'. The netlist file in AWR has the following contents:

.subckt BFG520W base collector emitter npn
.model BFG520W NPN(IS=1.016E-15 NF=1.000 BF=220.1 IKF=510E-3 VAF=48.06
+ ISE=2.83E-13 NE=2.035 NR=0.988 BR=100.7 IKR=2.352E-3
+ VAR=1.692 ISC=24.48E-18 NC=1.022 RB=10.00 RE=0.7753
+ RC=2.21 CJC=447.6E-15 MJC=0.07 VJC=0.1892
+ CJE=1.245E-12 TF=8.616E-12 TR=5.437E-12 mfg=NXP)

I have attached screenshots of the element BFG520W2 created due to the above netlist and the error I am getting while adding this element.

Hi I noticed that some figures from the old posts in the cadence blogs have been missing.

I think this problem happened before and Andrew Beckett asked the original author to fix the issue:

 Figures missing in the RF Design Blogs article of "Measuring Fmax for MOS Transistors" 

Some of these posts are quite valuable, and would be nice to have access to the figures, which are a very important part of some posts,

Thanks

Leandro

Read through this blog to know more about the new Reliability Report view in Virtuoso ADE Assembler and Virtuoso ADE Explorer.(read more)

In this post, we will learn about the most important parameters for the analog simulators that affect the accuracy of the simulation results. We will also understand how each parameter limits the accuracy of the measurements for the DC and transient analyses.(read more)

An AMS Designer Flex simulation gives you the most immediate access to the latest simulation technology on either side, gets out of the way of the core engines and allows the engine performance to shine while providing access to new features. Check out this blog to know more.

Che(read more)

This blog describes the new capabilities in Spectre 21.1 ISR2 through which it provides support to the Voltus-XFi Custom Power Integrity Solution.(read more)

Concurrent Layout Editing enables more than one designer to work in a hierarchy at the same time. Check out this blog to know more. (read more)

I am trying to figure out the most efficient workflow for adding test points. My use case involves adding ~100 or so SMT pads at the bottom for bed-of-nails ICT test that are required to be on a test point grid. A lot of the nets are on the top or from inner layers and so have to be brought to the bottom using stubs. I'm used to Xpediiton workflow of being able to set a test point padstack, set a test point grid, and then select a net, add the test point to the bottom layer on the grid with that net attached and then route the stub with gridless routing.

In Orcad, it seems I need to route the stub, switch layer pairs to be both bottom once I bring the stub to the bottom and then change the grid to be the test point grid and then add the test point on the grid. It requires a lot of clicks, very mistake prone requiring lots of oops and very slow for 100+ test points to be brought out at the bottom. 

I'm sure there is a better way that is used by folks with a lot of Orcad experience. Any suggestions?

Hello,

I have a sensitive trace on layer 2 and I would like to prevent any routing along or across it on adjacent layers (L1 and L3).

My idea was to use a route keepout shape on L1 and L3, however that also removed the ground pour on those layers and I would like to keep the ground pour.

Can I get around this somehow or should I use something else than route keepout?

Regards,

Filip

hello.

i have asked this question a few years back but no good answer so i ask again.

i would like to spread clines with equal spacing.

i do know how to spread clines between vias.

but i would like to simply spread clines between two clines (not between two vias).

for instance, there are 4 parallel clines but the inner 3 spaces are not equal so i would like to move the inner 2 clines to make the 3 spaces equal.

regards

masa

Hi

the signal SPI_SCLK belongs to TWO Spacing CLASSES: CLS_SP_SPI and CLS_SP_SPI_CLOCK

I then assign TWO different SPACING RULES to each class : CLS_SP_SPI  > 2H and CLS_SP_SPI_CLOCK > 3.5H

Which SPACING RULE will inherit the signal SPI_SCLK ??

Is it possible to manually define the PRIORITY on Design Rules ??

The default behaviour of Place replicate update is to select every new net item connected to the replicate module. This leads to an abundant number of clines, vias and shapes being selected, most of which I don't want to add to the replicate group. It is very tedious to unselect all these items and more often than not, I miss one or two items and then end up with a via or cline in a completely different place on the board or outside of the board.

Is there a way to change this rather annoying behaviour? I haven't found any way to disable it or to batch deselect everything the tool has decided to add to the replicate group.

The question has been asked before, but it didn't get any answers and the thread is now locked.

/F

I am using OrCAD PCB Designer Standard version 17.4-2019. I want to force update the Package_Height_Max property on the place bound top shape. The footprint library that we've created has that property set in the dra file, but I'd like to override that from capture so I can be certain that the height is correct.

This is coming from a place where we have created a very large footprint library over that past ++ years. Everyone who creates a new footprint is supposed to make sure that we add Package_Height_Max to the footprint, but of course footprints get reused for various parts, not all of which will have the same package height. What I want to do is export a list of package heights from our part database and then import the package heights into Capture and override the package height in the footprint.

I have found a post here  Using Height Property from Orcad Capture which says its not possible, but it also says its from 15 years ago, so maybe things have changed?

Any tips or SKIL files to help create a thermal shaped openings for paste masks for a donut shaped pin for mics or stand-offs like below?

Dear Community,

I have created a PCB layout with multiple high-speed nets, I want to check the SI like how signals are reflected and taken to each other.

I have the OrCAD X Professional, how to check the reflection and crosstalk using the OrCAD X Professional software version 24.1.

I want to create a topology flow to the PCB layout and perform the reflection and crosstalk.

Regards,

Rohit Rohan

Dear Community,

In OrCAD X Profession, the workspace feature enables the users to store the libraries (Schematic Symbol, Footprint and PSpice Models) and Designs (Schematic and PCB layout) in the cloud workspace.

But storing these libraries and design are stored in servers in the USA, Europe, Asia and Japan Servers.

I don't want to store my designs in any of these servers instead I want to create the workspace in my local PC and store all my libraries and designs in the local workspace.

Is this possible, if possible then can anyone provide the steps/procedure or videos of how to do it?

Regards,

Rohit Rohan

Dear Community,

I have created a PCB board and let's say I have found some parts of the PCB board where there are impedance issues, then how to resolve that impedance issue using the OrCAD X Professional.

Regards,

Rohit Rohan

Hai Community,

What are the differences between the Cadence OrCAD / Allegro 24.1 with the Altium Designer 24.

Can I get the grid matrix difference between these two tools?

Regards,

Rohit Rohan

Socionext, a leader in SoC design, recently made significant strides in enhancing its design efficiency for a complex billion-gate project. Faced with the initial challenges of lengthy eight-day iterations and a protracted two-month timing signoff process, the objective was to reduce the iteration cycle to just three days. By integrating Cadence's cutting-edge solutions—Certus Closure Solution, Tempus Timing Solution, and Quantus Extraction Solution—Socionext achieved remarkable improvements.

Notably, the Tempus DSTA tool dramatically cut timing closure time by 73%, outperforming conventional single-machine STA methods. This achievement, combined with the synergistic use of Cadence's Certus Closure and Tempus Timing solutions, allowed Socionext to meet their ambitious three-day iteration target and double productivity. Additionally, integrating these solutions significantly decreased both human and machine resource needs, slashing memory and disk costs by up to 90% and halving engineering resources during the optimization and signoff phases.

For more on this collaboration, check out the "Designed with Cadence" success story video on Cadence's website and YouTube channel.

Also, don't miss the on-demand webinar "Fast, Accurate STA for Large-Scale Design Challenges," which provides a deeper dive into Socionext's breakthroughs and the innovative solutions that powered their success.

The blog discusses Voltus InsightAI RAK that is designed to give you an accelerated start on the execution of Voltus InsightAI flow.(read more)

Training Bytes are not just short technical videos; they are particularly designed to provide comprehensive support in understanding and learning various concepts and methodologies.

These comprehensive yet small Training Bytes can be created to show various concepts and processes in a shorter pane of five to ten minutes, for example, running DFT synthesis, scanning insertion, inserting advanced testability features, test point insertion, debugging DFT violations, etc.

In this blog, we will show you the DFT Synthesis Flow with Cadence's Genus Synthesis Solution using small Training Bytes available on the Cadence Learning and Support Portal. To explore these training bytes more, log on to support.cadence.com and select the learning section to choose the training videos, as shown below.

DFT Synthesis Flow with Genus Synthesis Solution

First, we will understand the Synthesis Flow with DFT in the Genus Synthesis Solution:

Understanding a Script File that Used to Run the Synthesis Flow With DFT

Here, we will show you "How to run the Test Synthesis Flow to Insert Scan Chains and Improve the Testability of a Design" in the Genus Synthesis Solution:

Running Test Synthesis Flow to Insert Scan Chains And Improve the Testability of a Design in the Genus Synthesis Solution

Let's check the flops marked with the dft_mapped attribute for scan mapping in Genus Synthesis Solution:

How to Check Flops Marked With dft_mapped Attribute For Scan Mapping in Genus Synthesis Solution?

How to Find Non-Scan Flops of a Design in Genus? (Video)

Once the flops are mapped to scan flip flops and the scan chain inserted, we will see how to handle the flops marked with the dft_dont_scan attribute for scan mapping in Genus Synthesis Solution.

How to Handle the Flops Marked With the dft_dont_scan Attribute For Scan Mapping in Genus Synthesis Solution?

Here, we will see how to fix DFT Violations using the command fix_dft_violations:

Fixing DFT Violations (Video)

Once the design has been synthesized, let's explore the DFT design hierarchy in Genus Stylus CUI:

Exploring DFT Design Hierarchy in Genus Stylus CUI (Video)

Understand why sequential elements are not mapped to a scan flop:

Why Are Sequential Elements Not Mapped to a Scan Flop?

Explore hierarchical scan synthesis in Genus Stylus Common UI:

Understanding Hierarchical Scan Synthesis in Genus Stylus Common UI. (Video)

To understand how to resolve different warnings and errors (for example, DFT-415, DFT-512, DFT-304, etc.) in Genus Synthesis Solution, here are some videos you can refer to:

How to Resolve Warning: DFT-415 (Video)

How to Resolve Error: DFT-407 (Video)

How to Resolve Error: DFT-404 (Video)

DFT-510 Warning During Mapping (Video)

How to Resolve Warning: DFT-512 (Video)

How to Resolve Warning: DFT-511 (Video)

How to Resolve Warning: DFT-304 (Video)

How to Resolve Warning: DFT-302 (Video)

How to Resolve Error: DFT-515 (Video)

How to Resolve Error: DFT-500 (Video)

Here, we will see how we can generate SDC constraints for DFT constructs for many scan insertion techniques, such as FULLSCAN, OPCG, Boundary Scan, PMBIST, XOR Compression, SmartScan Compression, LBIST, and IEEE 1500:

How to Generate SDC Constraints for DFT Constructs in Genus Synthesis Solution? (Video)

Explore advanced testability features that can be inserted in Genus Synthesis Solution, such as Boundary Scan, Programmable Memory built-in Self-Test Logic (PMBIST), Compression Logic, Masking, and On-Product Clock Generation Logic (OPCG):

Advanced Testability Features (Video)

To understand What the IEEE 1500 Wrapper and its Insertion Flow in Genus Synthesis Solution, follow the bytes:

What Is IEEE 1500 Wrapper? (Video)

IEEE 1500 Wrapper Insertion Flow in Genus Synthesis Solution (Video)

Understand the On-product Clock Generation (OPCG) insertion flow in Genus Synthesis Solution Stylus CUI with this byte:

Understanding On Product Clock Generator (OPCG) Insertion in Genus Stylus CUI (Video)

To debug DFT violations, you can use DFT Analyzer from Genus GUI and explore its features here:

Debugging Using GUI: DFT Analyzer (Video)

Exploring DFT Analyzer View of Genus Synthesis Solution GUI (Video)

To understand What is Shadow Logic, How to Insert Test Points, How to do Testability Analysis Using LBIST, and How to Deterministic Fault Analysis in Genus, follow this article:

What is Shadow Logic

To insert the Boundary Scan Logic in and control Boundary Optimization in Genus Synthesis Solution, refer to these small bytes:

How to Insert Boundary Scan Logic in Genus? Video)

Controlling Boundary Optimization in Genus Synthesis Solution Stylus CUI (Video)

Compression techniques are used during scan insertion to reduce the test data volume and test application time (TAT) while retaining the test coverage. To understand what compression and the compression techniques are, watch this article:

What is Compression Technique During Scan Insertion? (Video)

Interested to know what "Unified Compression" is? To get the concept, you can watch this small demo:

What Is Unified Compression? (Video)

To Explore More, Register for Online Training

• Log on to Cadence.com with your registered Cadence ID and password.
• Select Learning from the menu > Online Courses.
• Search for "Test Synthesis with Genus Stylus Common UI" using the search bar.
• Select the course and click "Enroll."

The traditional methods of power analysis lag by various shortcomings and challenges:

• Getting an accurate measure of RTL power consumption during design exploration
• Getting consistent power through the design progress from RTL to P&R.
• System-level verification tools are disconnected from the implementation tools that translate RTL to gates and wires.

The Cadence Joules RTL Power Solution closes this gap by delivering time-based RTL power analysis with system-level runtimes, capacity, and high-quality estimates of gates and wires based on production implementation technology. The Cadence Joules RTL Power Solution is an RTL power analysis tool that provides a unified engine to compute gate netlist power and estimate RTL power. The Joules solution delivers 20X faster time-based RTL power analysis and can analyze multi-million instance designs overnight, with impressive accuracy within 15% of signoff power.

Moreover, it integrates seamlessly with numerous Cadence platforms, eliminating compatibility and correlation issues! In addition, the Joules RTL Power Solution GUI (Graphical User Interface) helps you analyze/debug the power estimation/results using several GUI capabilities.

Want to take a tour of this power estimation world? Gear up to attend the training class created just for you to dive deep into the entire flow and explore this exciting power estimation method/flow with hands-on labs in two days!

Training

In the Joules Power Calculator Training course, you will identify solutions and features for RTL power using Cadence Joules RTL Power Solution. You will set up and run the RTL power flow with Joules RTL Power Solution and identify Joules's Graphical User Interface (GUI) capabilities. The training also explores how you can estimate power using vectorless power, stimulus flow, RTL Stim to Gate flow, and replay flow, and also interfaces Joules with Cadence's Palladium Emulation Platform. You will estimate power at the chip level and understand how to navigate the design and data mining using Joules.

The training also covers power exploration features and how to analyze ideal power and ODC-driven sequential clock gating. You will identify low-activity registers at the clock gate. You will also identify techniques to analyze power, generate various reports, and analyze results through Joules GUI. The training covers multiple strategies to debug low stimulus annotation and how you can better correlate RTL power with signoff. You also identify Genus-Joules Integration. In addition, we ensure that your learning journey is smooth with hands-on labs covering various design scenarios.

Lab Videos

To start you on your exciting journey as an RTL power analysis expert, we have created a series of short channel lab videos on our Customer Support site: Lab Demo: Setting Up and Running Basic RTL Power Flow in Joules RTL Power Solution (Video). You can refer to each lab module's instructions in demo format. This will help accelerate your tool ramp-up and help you perform the lab steps more quickly if you are stuck. You might be a beginner in the RTL power analysis world, but we can help you sail through it smoothly.

What's Next?

Grab your badge after finishing the training and flaunt your expertise!

Related Training

• Genus Low-Power Synthesis Flow with IEEE 1801
• Low-Power Synthesis Flow with Genus Stylus Common UI

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The Cadence Cerebrus Intelligent Chip Explorer is a revolutionary, machine learning-driven, automated approach to chip design flow optimization. Block engineers specify the design goals, and Cadence Cerebrus will intelligently optimize the Cadence digital full flow to meet the power, performance, and area (PPA) goals in a completely automated way. Use Cerebrus Apps to optimize some aspects of the design as well.

Running a full RTL to GDSII flow, Cadence Cerebrus has a lot of possibilities and combinations of different tool settings to explore.

Using the knowledge from previous runs, combined with on-the-fly analysis within the flow, Cadence Cerebrus can assess many settings combinations and fine-tune the flow accordingly in a very efficient manner.

As technology advances, projects become bigger and way more complex than before. The ability of a single engineer to run simultaneously a large number of blocks in a traditional way is limited. Cadence Cerebrus allows a single engineer to work more efficiently and implement more blocks, while maintaining the same or even better PPA, using compute power.

Being such a revolutionary tool, integrating Cerebrus into your existing flow is surprisingly simple as it can wrap around any existing flow scripts.

Please join me in this course, to learn about the features and basics of Cadence Cerebrus Intelligent Chip Explorer.

We’ll walk through the tool setting stage, explain what is a primitive and how it effects our run, talk about the cost function and the run goals.

We’ll understand the concept of scenarios, learn how to analyze the results of the different runs, and compare them.

In addition, we’ll talk about basic debug rules and methods to analyze failures.

Sounds Interesting?

Please join our “live” one-day Cadence Cerebrus Intelligent Chip Explorer Training @Cadence Feldkirchen planned for October 9th, 2024!

For more details and registration, please contact Training Germany.

If you would like to have an instructor-led training session in another region please contact your local training department.

Become Cadence Certified

Cadence Training Services offers a digital badge for this training course. This badge indicates proficiency in a certain technology or skill and gives you a way to validate your expertise to managers and potential employers. You can highlight your expertise by adding this digital badge to your email signature or any social media platform, such as Facebook or LinkedIn.

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This blog informs about the new badge certification available for Cadence Certus Closure Solution, that grants credit to your proficiency.(read more)

In this recent Training Webinar, we explore the concepts of RTL design, design verification, and coverage analysis while unveiling the exciting world of front-end design flow by guiding you through essential steps involved in creating integrated circuits—the building blocks of modern electronics.

We’ll break down the process into manageable stages, from defining the chip’s functionality to its physical realization. We’ll investigate the front-end part of the RTL-to-GDSII flow—from specification to functional verification and design coverage—and explore:

• Key concepts of specifying chip behavior and performance
• How to translate ideas into a digital blueprint and transform that into a design
• How to ensure your design is free of errors

Watch the Training Webinar recording from September 18, 2024: A Beginner’s Guide to RTL-to-GDSII Front-End Flow

Want to Learn More?

This link gives you more information about this RTL-to-GDSII Flow, the related training course, and a link to enroll:

Cadence RTL-to-GDSII Flow Training

The course includes slides with audio and downloadable laboratory exercises designed to emphasize the topics covered in the lecture. There is also a Digital Badge available for the training.

 Also, take this opportunity to register for the free Online Training related to this Webinar Topic.

Cadence RTL-to-GDSII Flow

Xcelium Simulator

Verilog Language and Application

Learning Maps

The online class is free for all Cadence customers with a Cadence Learning and Support Portal account. For instructor-led training sessions "Live" or "Blended" please contact Cadence Training.

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