AWR V22.1 software introduces the Pointer-Hybrid optimization method which uses a combination of optimization methods, switching back and forth between methods to efficiently find the lowest optimization error function cost. The optimization algorithm automatically determines when to switch to a different optimization method, making this a superior method over manual selection of algorithms. This method is particularly robust in regards to finding the global minima without getting stuck in a local minima well.(read more)

When starting a new design, it's important to take the time to consider design recommendations that prevent problems that can arise later in the design cycle. This two-part compilation of guidelines for starting a new design is the result of years of Cadence AWR Design Environment platform Support experience with designs. Pre-design decisions for user interface, simulation, layout, and library configuration lay the groundwork for a successful and efficient AWR design. This blog, part 2, covers the layout and component library considerations designers should note prior to starting a design.(read more)

Microwave Office is Cadence’s tool-of-choice for RF and microwave designers designing everything from III-V 5G chips, to RF systems in board and package technologies. These types of designs require close interaction between the schematic and its layout. A new Training Byte demonstrates how the schematic-layout connections is built into Microwave Office.(read more)

Data sets are a powerful and easy-to-use feature in Microwave Office. Data can be effortlessly be swapped in graphs, and circuit schematics.(read more)

A training webinar on Microwave Office will be given June 27, 2023. The emphasis will be on EM simulation.(read more)

A recording of a training webinar on Microwave Office is available. Topics show the design environment, with special emphasis placed on electromagnetic (EM) simulation. Normal 0 false false false EN-US JA X-NONE ...(read more)

By David Vye, Senior Product Marketing Manager, AWR, Cadence When designing multi-octave high-power amplifiers, it is a challenge to achieve both broadband gain and power matching using a combination of lumped and distributed techniques. One approach...(read more)

Are you ready to revolutionize your RF design experience? Look no further! Cadence AWR software is your gateway to mastering the intricacies of Radio Frequency (RF) circuit design, and now, you can explore its power with our exclusive Free Academic T...(read more)

Hello All:

I am looking for help on the following, as I am new to Cadence tools [I have to use Cadence Innovus for Physical Design after Logic Synthesis using Synopsys Design Compiler, using Nangate 45 nm Open Cell Library]: while using Cadence Innovus, I would need to select a few specific nets to be routed through a specific metal layer. How can I do this on Innovus [are there any command(s)]? Also, would writing and sourcing a .tcl script [containing the command(s)] on the Innovus terminal after the Placement Stage of Physical Design be fine for this?

Secondly, is there a way in Innovus to manipulate layout components, such as changing some pin placements, wire directions (say for example, wire direction changed to facing east from west, etc.) or moving specific closely placed cells around (without violating timing constraints of course) using any command(s)/.tcl script? If so, would pin placement changes and constraining some closely placed cells to be moved apart be done after Floorplanning/Powerplanning (that is, prior to Placement) and the wire direction changes be done after Routing? 

While making the necessary changes, could I use the usual Innovus commands to perform Physical Design of the remaining nets/wires/pins/cells, etc., or would anything need modification for the remaining components as well?

I would finally need to dump the entire design containing all of this in a .def file.

I tried looking up but could only find matter on Virtuoso and SKILL scripting, but I'd be using Innovus GUI/terminal with Nangate 45 nm Open Cell Library. I know this is a lot, but I would greatly appreciate your help. Thanks in advance.

Riya

Hi,

I have synthesized a verilog code. When performing the pnr in innovus it is showing the error "Instance g5891__718 (similar for other) of the cell AND2_X6 has no physical library or has wrong dimension  values (<=0). Check your design setup to make sure the physical library is loaded in and attribute specified in library are correct.

When importing synthesized netlist in virtuoso then it says " Module AND2_X6, instantiated in the top module decoder, is not defined. Therefore the top module decoder will be imported as functional."

Please help what's going on here? 

i want to read from text file two values  on two ports , i wrote  that  code, and i have that error that shown in the image below . and also the data in text file is shown as screenshot

module read_file (a,b);

electrical a,b;
integer in_file_0,data_value, valid, count0,int_value;

analog begin
@(initial_step) begin
in_file_0 = $fopen("/home/hh1667/ee610/my_library/read_file/data2.txt","r");

valid = $fscanf (in_file_0, "%b,%b" ,int_value,count0);
end

V(a) <+ int_value;
V(b) <+ count0;

end

endmodule

Hi Cadence, 

I use simvision 20.09-s007 but my computer screen resolution is very high. As a result, the texts are too small. 

In ~/.simvision/Xdefaults I changed that number to 16, from 12. But the signal names in the waveform traces don't reflect the change. 

Simvision*Font: -adobe-helvetica-medium-r-normal--16-*-*-*-*-*-*-*

Other .font changes seem to reflect on the simvision correctly, except the signal names. 

How do I fix that? I dont mind a single variable to change all the texts fonts to 16. 

Thank you!

PS: I found the answer with another post. I change Preference/Waveform/Display/Signal Height. 

I am scripting gds streamin using 'strmin', which works fine so far.

But, as it apparently doesn't have an option to specify where the cds.lib file is, I have to run it from the directory where the cds.lib file is, or I guess I could create a dummy one to source that one.

Is there a way to tell strmin where the cds.lib file is?

Dear all, 

I'm trying to perform an LVS check using Calibre between a layout that was generated by Innovus and the initial netlist generated by Genus. However, once I hit Run LVS on Calibre, it reports the following warnings and recommends to stop the process:

Source netlist references but does not define more than 10 subckts:
DFD1BWP7T
DFKCND1BWP7T
DFKCNQD1BWP7T
DFKSND1BWP7T
DFQD1BWP7T
IND2D0BWP7T
INR2D0BWP7T
INVD0BWP7T
INVD2P5BWP7T
IOA21D0BWP7T
... (and more)

If I proceed the LVS process it shows lots of errors as shown in the following image:

Why Genus doesn't include the definition of those sub circuits in the generated netlist? Is this related to Flat/Hierarchy netlisting? 

I have included my Genus scripts as well as the generated netlist in the attachments (and here - if attachment don't work).

Many thanks,

Anas

This document resolved my first query,

Article (11638952) Title: How to output power and ground nets to GDS
URL: support.cadence.com/.../ArticleAttachmentPortal

but now I have 20 power and 20 ground

below is my code

------------------------------------------------
variable GND "vss1" "vss2" "vss3" ... "vss20"
variable VDD "vdd1" "vdd2" "vdd3" ... "vdd20"

select_net M1 GND -outputlayer GND_M1
select_net M2 GND -outputlayer GND_M2
...
select_net AP GND -outputlayer GND_AP

select_net M1 VDD -outputlayer VDD_M1
select_net M2 VDD -outputlayer VDD_M2
...
select_net AP VDD -outputlayer VDD_AP

rule GND{

copy GND_M1
copy GND_M2
...
copy GND_AP}

rule VDD{

copy VDD_M1
copy VDD_M2
...
copy VDD_AP}
------------------------------------------------

I want 20 GND and 20 VDD are separately to highlight,
like this

Can DRC command use for-loop(skill or Tcl) to split the rule?
or how can I do to split it? 
I don't really want to repeat the rule 40 times..haha😅 (use Pegasus 22.21)

Hi Cadence & forumers, 

I am running a conformal LEC with a flattened netlist against RTL. 

The run hang for 5 days at the "analyze abort" step which is automatically launched by the compare. 

The netlist is flattened at some levels so hierarchical flow which I tried didn't help much. The flattened/highly optimized netlist is from customer and the ultimate goal. How shall I proceed now? 

On the a side note, a test run with a hierarchical netlist from a simple DC "compile -map_effort medium" command finished after 1 day or so. 

Thank you! 

// Command: vpx compare -verbose -ABORT_Print -NONEQ_Print -TIMEstamp
// Starting multithreaded comparison ...
Comparing 241112 points in parallel.

// Multithreading Overhead: 38% Gates: 8501606/6168138
// Multithreaded processing completed.
================================================================================
Compared points PO DFF DLAT BBOX CUT Total
--------------------------------------------------------------------------------
Equivalent 1025 241638 30 75 21 242789
--------------------------------------------------------------------------------
Abort 0 124 0 0 0 124
================================================================================
Compare results of instance/output/pin equivalences and/or sequential merge
================================================================================
Compared points DFF Total
--------------------------------------------------------------------------------
Equivalent 204 204
================================================================================
// Warning: 512 DFFs/DLATs have 1 disabled clock port: skipped data cone comparison
// Resolving aborts by analyze abort...

I'm currently trying to explore the verilog simulation option in cadence.

One thing that comes to my mind that if there exists a way in cadence workflow to dump selected register/wire's waveform during the simulation. 

Are there any additional tools needed apart from xcelium, is there a tutorial or specific training course for this aspect. I glance through Xcelium Simulator Course Version 22.09, but it seems not having related context. 

I know in Synopsys's workflow, it can be realized using verdi & fsdb in the command line as follows:

if (inst.CTRL_STATE==STATE_START_TO_DUMP)

$fsdbDumpvars(0, inst_1.reg_0);

end

Thanks in advance!

Good morning,
I dug up an old project from 2005 and I should open the schematic to check some things.
This is the schematic of a XILINX XC95108-pq160 CPLD which the XILINX ISE 6.1 software then translated and compiled, to generate a JEDEC file to burn CPLD.

My problem is that I can't open schematics with the versions of Orcad Schematic Entry that I have.
Can anyone help me understand which version of Orcad Schematic Entry I need to install to see these files?

I shared the files on:
drive.google.com/.../view

Thank you very much

Hi, have two designs and would like to copy paste one area of circuit from the old design to the new design, best way/approach and guidance please..

Hello,

I am trying to load some of the signals of the design saved in the signals.svwf to the waveform windown via the tcl file, I am using the following commands but nothing works, Can you please help 

 -submit waveform loadsignals -using "Waveform 2" FB1.svwf but it gives me the below error

-submit waveform new -reuse -name Waveforms

I was trying to remove the cdn_loop_breaker cells from the netlist. 
When I tried the below 2 things, it removing the cdn_loop_breaker cells but while connecting the cdn_loop_breaker cell input to its proper connection, its somehow misleading the connections

Things i tried:
1.  remove_cdn_loop_breaker -instances *cdn_loop_breaker*
then i just ran remove_cdn_loop_breaker  comand without the -instances switch
2. remove_cdn_loop_breaker  
     
both of the above things are not providing the proper connections after removing the loop_breaker_cells

I want to use a transmission gate in my design, but it is not available as a standard cell for Genus RTL synthesis. How can I perform an analysis of area, power, and critical path delay that includes the transmission gate alongside standard cells?

Could you provide guidance or a methodology for integrating custom cells, like the transmission gate, into the synthesis flow for accurate analysis?

Hi ,

 I am using conformal v23.2 for LEC checking b/w netlist vs Netlist. I am getting 8 not mapped points(z) in revised but when i check in mapping manager it showing 0 Not mapped points and showing this 8 not mapped points in extra unmapped section z(f) snps_scan_out_6 .How to resolve this issue Pls help

regards,

We have a big circuit having 12K gates totally and trying to show it in one page slide visually. But it is so hard for us to shrink it down from gate-level to module-level. Do you have any function like these:

• Toggle wires on and off
• “Right click” elements and group them into black boxes
• Quickly left or right align elements to clean up pictures

I am trying to understand the Linting process. I know that mainly JasperGold is the tool for this purpose. Though I think JasperGold is more suited for later stages of the design. As a RTL Design Engineer, I want to make sure that if another tool has the capability of doing Linting earlier in the flow. for example, does Xcelium, Genus or Confomal support linting. I have seen some contradicting information online regarding this topic, though I can't find anything related to Linting on any of these tools.

Thanks

Optimize Regression Suite, Accelerate Coverage Closure, and Increase hit count of rare bins using Xcelium Machine Learning. It is easy to use and has no learning curve for existing Xcelium customers. Xcelium Machine Learning Technology helps you discover hidden bugs when used early in your design verification cycle.(read more)

With the DRAM fabrication advancing from 1x to 1y to 1z and further to 1a, 1b and 1c nodes along with the DRAM device speeds going up to 8533 for Lpddr5/8800 for DDR5, Data integrity is becoming a really important issue that the OEMs and other users have to consider as part of the system that relies on the correctness of data being stored in the DRAMs for system to work as designed.

It’s a complicated problem that requires multiple ways to deal with it.

Traditionally one of the main approaches to deal with data errors is to rely on the ECC. ECC requires additional memory storage in which the ECC codes will calculated and stored at the time of memory write to DRAM. These codes will be read back along with the memory data during to the reads and checked against the data to make sure that there are no errors. Typical ECC schemes use Hamming code that provide for single bit error correction and double bit error detection per burst. Also, while several of previous generation of DRAM required Host to keep aside system memory for ECC storage latest DRAMs like Lpddr5 and DDR5 support on die ECC as part of the normal DRAM function that can be enabled using mode registers. DDR5 further requires Host to run through an ECC Error Check and Scrub (ECS) cycle on an average every tECSint time (Average Periodic ECS Interval) to prevent data errors.

Not meeting the DRAM Refresh requirement is a major reason that can lead to loss of data. This could be challenging as the PVT variation can cause the refresh requirement to change over time. Putting the DRAM in Self Refresh mode can help off-loading Refresh tracking responsibilities to DRAM but may prevent Host to do other scheduling optimizations and should be carefully considered.

Some of the other things that can affect the DRAM data are

1. Row hammer where same or adjacent rows are activated again and again leading to loss or changing of data contents in the rows that has not being addressed. Latest DRAMs like Lpddr5/Ddr5 support Refresh Management (including DRFM and ARFM) that allows the Host to compensate for these problems by issuing dedicated RFM commands helping DRAMs deals with potential Data loss issues arising out of Row hammer attacks.
2. Device temperature is another important factor that the Host needs to be aware of and if the application requires DRAM to operate at elevated temperature. The user needs to check with DRAM Vendor on the temperature range that DRAM can still operate. Data integrity at thresholds greater than certain temperature is not assured regardless of refresh rate unless DRAM is manufactured to withstand that.
3. Loss of power to DRAM will cause DRAM to lose all its contents. If this is a real concern for the system designer, they should consider using NVDIMM-N devices which has an onchip controller and a power source which is just enough to allow the DRAM contents to be copied into a backup non-volatile memory before power is lost. When the power is stored back, the stored memory contents in the non-volatile memory will be written back to the DRAM and system can continue to operate as it was before the power loss event occurred.

For transmissions and manufacturing errors DRAMs support additional features like CRC, DFE, Pre-Emphasis and PPR which will be covered in the next blog.

Cadence MMAV VIPs for DDR5/DDR5 DIMM and LPDDR5 are compressive VIP solutions and supports all of the above-listed Data integrity features including support for ECC error injection and SBE correction/DBE detection to assist with the verification challenges dealing with data integrity issues.

More information on Cadence DDR5/LPDDR5 VIP is available at Cadence VIP Memory Models Website.

Shyam 

The increase in compute and data-intensive applications and the need for lower power consumption have resulted in a rapidly growing number of Arm-based devices in various market segments; this requires fast time to market (TTM) and support for off-t...(read more)

Ensuring that the RTL designs correctly implement the C++ algorithmic intent in every circumstance is difficult to achieve with conventional verification. Learn more how Jasper C2RTL App helps to perform equivalence checking with 100x performance improvement(read more)

Learn how Xcelium PowerPlayback App enables the massively parallel Xcelium replay of waveforms for glitch-accurate power estimation of multi-billion gate SoC designs.(read more)

To stay ahead in competition in chip design real-time collaborations ensure traceability, speedy innovations at reduced the cost.(read more)

Xcelium Simulator has been in the industry for years and is the leading high-performance simulation platform. As designs are getting more and more complex and verification is taking longer than ever, the need of the hour is plug-and-play apps that ar...(read more)

Speed increase requirements keep on flowing by in all the domains surrounding us. The same applies to memory storage too. Earlier mobile devices used eMMC based flash storage, which was a significantly slower technology. With increased SoC processing speed, pairing it with slow eMMC storage was becoming a bottleneck. That is when modern storage technology Universal Flash Storage (UFS) started to gain popularity. 

UFS is a simple and high-performance mass storage device with a serial interface. It is primarily used in mobile systems between host processing and mass storage memory devices. Another important reason for the usage of UFS in mobile systems like smartphones and tablets is minimum power consumption. 

To achieve the highest performance and most power-efficient data transport, JEDEC UFS works in collaboration with industry-leading specifications from the MIPI® Alliance to form its Interconnect Layer. MIPI UniPro is used as a transport layer, and MIPI MPHY is used as a physical layer with the serial DpDn interface. 

UFS 4.0 specification is the latest specification from JEDEC, which leverages UniPro 2.0 and MPHY 5.0 specification standards to achieve the following major improvements:

• Enables up to 4200 Mbps read/write traffic with MPHY 5.0, allowing 23.29 Gbps data rate. 
• High Speed Link Startup, along with Out of Order Data Transfer and BARRIER Command, were introduced to improve system latencies. 
• Data security is enhanced with Advanced RPMB. Advance RPMB also uses the EHS field of the header, which reduces the number of commands required compared to normal RPMB, increasing the bandwidth. 
• Enhanced Device Error History was introduced to ease system integration. 
• File Based Optimization (FBO) was introduced for performance enhancement. 

Along with many major enhancements, UFS 4.0 also maintains backward compatibility with UFS 3.0 and UFS 3.1. 

JEDEC has just announced the UFS 4.0 specification release, quoting Cadence support as a constant contributor in the JEDEC UFS Task Group, actively participating in these specifications development.  

With the availability of the Cadence Verification IP for JEDEC UFS 4.0, MIPI MPHY 5.0 and MIPI UniPro 2.0, early adopters can start working with the provisional specification immediately, ensuring compliance with the standard and achieving the fastest path to IP and SoC verification closure.  

More information on Cadence VIP is available at the Cadence VIP Website. 

Yeshavanth B N 

It has become challenging to ensure that the designs are complete, correct, and adhere to necessary coding rules before handing them off for RTL verification and implementation. RTL Designer Signoff Solution from Cadence helps the user identify RTL bugs at a very early development stage, saving a lot of effort and cost for the design and verification team. Our reputed customers have confirmed that using RTL signoff for their design IP helped save up to 4 weeks and reduce the late-stage RTL changes by up to 80%.(read more)

NAND Flash memory is now a widely accepted non-volatile memory in many application areas for data storage such as digital cameras, USB drive, SSD and smartphones. One form of NAND flash memory, Toggle NAND, was introduced to transmit high-speed data asynchronously thus consuming less power and increasing the density of the NAND flash device. 

The initial Toggle NAND versions had memory arranged in terms of SLC (Single Level Cell) or MLC (Multi Level Cell) mode that was considered as a 2D scalar stack and their frequency of operation was also less. The ever-growing demand of high memory capacity and high throughput required further research in the areas like the shrinking size of cell, performance to fill-in these gaps.

Some of these new requirements were incorporated, leading to newer versions of Toggle NAND, namely 3.0 and 4.0, with a re-arrangement of the internal memory developing a 3D layer of memory. With such structures, higher capacity of the memory was possible, but performance was the primary challenge as the latency of the write/read of memory quadrupled with the same frequency.

The key to improving the performance and run the device at very high speed in low power mode was to enhance the frequency of operation for faster read/writes to the memory and reduce the voltage levels.

But with every technology advancement comes some other problems, the next being the data sampling at that high frequency that can cause setup/hold time issues. To overcome these concerns, different types of trainings on the signal interface were made mandatory that shall assist in proper sampling of the data. Few other features for improving the integrity of the signals were added.

The current set of commands were applicable to access the SLC and MLC memory modes but with the 3D layering, these commands were lacking access to the entire set of TLC (Triple Level Cell) and QLC (Quad Level Cell) memory modes. Thus, more commands were required to make sure that the 3D layering was fully written/read.

Main features of Toggle NAND 4.0 :

• High Density of Memory
• High Frequency of operation, greater than 800 MHz
• Data Trainings

Cadence Verification IP for Flash Toggle NAND 4.0 is available to support the newer version of Flash Toggle NAND 4.0, allowing to simulate the memory device for efficient IP, SoC, and system-level design verification. Semiconductor companies can start using it to fully verify their controller design and achieve functional verification closure on it within no time. 
 
Gaurav 

The rising customer expectations, intermingling fields and high performance needs can be satisfied with the system based design. An intelligent Systems Design strategy can offer a quicker route to an optimum design and helps to increase designers' productivity and analyzes efficiency by providing the ability to explore the entire design space. Cadence Intelligent System Strategy enables a system design revolution and reduces project schedules with optimized continuous integration.(read more)

One of the key goals for USB4 is to retain compatibility with the existing ecosystem of USB3.2, USB 2.0 and Thunderbolt  products, and the resulting connection scales to the best mutual capability of the devices being connected. USB4 is designed to work with older versions of USB and Thunderbolt . USB4 Fabric support high throughput interconnects of 10 Gbps (for Gen 2) and 20 Gbps (for Gen 3) and supports Thunderbolt 3-compatible rates of 10.3125 Gbps (for Gen 2) and 20.625 Gbps (for Gen 3). It becomes very important to verify the Thunderbolt  backward compatibility with the designs. Though the support of USB4 Interoperability with Thunderbolt  3 (TBT3) is optional in USB4 host or USB4 peripheral device and required USB4 Hub and USB4 Based Dock but it is very essential to work in the existing ecosystem. 

Few Main features of USB4 Interoperability with Thunderbolt  3 (TBT3) Systems

• Support for Bi-Directional Pins & Retimers: TBT3 Active Cables can contain two bidirectional Re-timers which have the capability to send AT Responses on its RX channel. Router connected directly to such Retimer needs to support A Router that is connected directly to a bidirectional Re-timer shall support reception of Transactions on both TX and RX channels. 

• Bounce Mechanism: This feature is used by Router to access the Register Space of a Cable Re-timer that can only be accessed by its Link Partner.
• Asymmetric Negotiation: The Router which connects with Cable Retimers needs to follow Asymmetric TxFFE in Phase 5 of Lane Initialization. 
• USB4 Link Transitions: In TBT3 mode, the configuration of two independent Single Lane Links can be used non-transient state or Single Lane Link just using the Lane1 Adapter.

Cadence has a mature USB4 Verification IP solution that can help in the verification of USB4 designs with TBT3. Cadence has taken an active part in the Cairo group that defined the USB4 specification and has created a comprehensive Verification IP that is being used by multiple members. If you plan to have a USB4-compatible design, you can reduce the risk of adopting new technology by using our proven and mature USB4 Verification IP. Please contact your Cadence local account team, for more details.

Achieving optimal power transfer in RF PCBs hinges on meticulously routed traces that meet specific impedance requirements. Impedance matching is essential to ensure that traces have the same impedance to prevent signal reflection and inefficient pow...(read more)

At what stage in the design cycle do you start to think about the PCB material costs? What about the costs to assemble the PCB? Once a design becomes successful, should you then redesign it to achieve a scalable product? Placing components and routi...(read more)

OrCAD X is the next-generation integrated PCB design platform. It brings to you a powerful cloud-enabled design solution that includes design and library data management integrated with the proven PCB design and analysis product portfolio of Cad...(read more)

Introduction

Multiphysics is an integral part of the concepts around digital twins. In this post, I want to discuss the mechanical aspects of multiphysics in system simulations, which are critical for 3D-IC, multi-die, and chiplet design.

The physical world in which we live is growing ever more electrified. Think of the transformation that the cell phone has brought into our lives, as has the present-day migration to electronic vehicles (EVs). These products are not only feats of electronic engineering but of mechanical as well, as the electronics find themselves in new and novel forms such as foldable phones and flying cars (eVOTLs). Here, engineering domains must co-exist and collaborate to bring about the best end products possible.

Start with the electronics—chips, chiplets, IC packaging, PCB, and modules. But now put these into a new form factor that can be dropped or submerged in water or accelerated along a highway. What about drop testing, aerodynamics, and aeroacoustics? These largely computational fluid dynamics (CFD) and/or mechanical multiphysics phenomena must also be accounted for. And then how does the drop testing impact the electrical performance? The world of electronics and its vast array of end products is pushing us beyond pure electrical engineering to be more broadly minded and develop not only heterogeneous products but heterogeneous engineering teams as well.

Cadence's Unique Expertise

It's at this crossroad of complexity and electronic proliferation that Cadence shines. Let's take, for example, the latest push for higher-performing high-bandwidth memory (HBM) devices and AI data center expansion. These technologies are growing from several layers to 12, and I can't emphasize enough the importance of teamwork and integrated solutions in tackling the challenges of advanced packaging technologies and how collaboration is shaping the future of semiconductor innovation and paving the way for cutting-edge developments in the industry.

These layered electronics are powered, and power creates heat. Heat needs to be understood, and thus, the thermal integrity issues uncovered along the way must be addressed. However, electronic thermal issues are just the first domino in a chain of interdependencies. What about the thermal stress and warpage that can be caused by the powering of these stacked devices? How does that then lend to mechanical stress and even material fatigue as the temperature cycles from high to low and back through the use of the electronic device? This is just one example in a long list of many...

Cadence Multiphysics Analysis Offerings

The confluence of electrical, mechanical, and CFD is exactly why Cadence expanded into multiphysics at a significant rate starting in 2019 with the announcement of the Clarity 3D Solver and Celsius Thermal Solver products for electromagnetic (EM) and thermal multiphysics system simulations. Recent acquisitions of Numeca, Pointwise, and Cascade (now branded within Cadence as the Fidelity CFD Platform) as well as Future Facilities (now the Cadence Reality Digital Twin product line) are all adding CFD expertise. The recent addition of Beta CAE brings mechanical multiphysics to the suite of solutions available from Cadence. The full breadth of these multiphysics system analyses, spanning EM, thermal, signal integrity/power integrity (SI/PI), CFD, and now mechanical, creates a platform for digital twinning across a wide array of applications. You can learn more by viewing Cadence's Reality Digital Twin platform launch on the keynote stage at NVIDIA's GTC in March, as well as this Designed with Cadence video: NV5, NVIDIA, and Cadence Collaboration Optimizes Data Centers.

Conclusion

Ever more sophisticated electronic designs are in demand to fulfill the needs of tomorrow's technologies, driving a convergence of electrical and mechanical aspects of multiphysics in system simulations. To successfully produce the exciting new products of the future, both domains must be able to collaborate effectively and efficiently. Cadence is fully committed to developing and providing our customers with the software products they need to enable this electrical/mechanical evolution. From EM, to thermal, to SI/PI, CFD, and mechanical, Cadence is enabling digital twinning across a wide array of applications that are forging pathways to the future.

For more information on Cadence's multiphysics system analysis offerings, visit our webpage and download our brochure.

Explore Impacts of Finite Interconnect Impedance on PDN Characterization

Over the past few decades, many details have been worked out in the power distribution network (PDN) in the frequency and time domains. We have simulation tools that can analyze the physical structure from DC to very high frequencies, including spatial variations of the behavior. We also have frequency- and time-domain test methods to measure the steady-state and transient behavior of the built-up systems.

All of these pieces in our current toolbox have their own assumptions, limitations, and artifacts, and they constantly raise the challenging question that designers need to answer: How to select the design process, simulation, measurement tools, and processes so that we get reasonable answers within a reasonable time frame with a reasonable budget.

Read this award-winning DesignCon 2024 paper titled “Impact of Finite Interconnect Impedance Including Spatial and Domain Comparison of PDN Characterization.” Led by Samtec’s Istvan Novak and written with a team of nine authors from Cadence, Amazon, and Samtec, the paper discusses a series of continually evolving challenges with PDN requirements for cutting-edge designs.

Read the full paper now: “Impact of Finite Interconnect Impedance Including Spatial and Domain Comparison of PDN Characterization.”

Community engagement is a dynamic concept that does not adhere to a singular, universal approach. Its various forms, methods, and objectives can vary significantly depending on the specific context, goals, and desired outcomes. Whether you seek assis...(read more)

Power network design and analysis of 3D-ICs is a major challenge due to the complex nature and large size of the power network. In addition, designers must deal with the complexity of routing power through the interposer, multiple dies, through-silicon vias (TSVs), and through-dielectric vias (TDVs).
Cadence’s Integrity 3D-IC Platform and Voltus IC Power Integrity Solution provide a fully integrated solution for early planning and analysis of 3D-IC power networks, 3D-IC chip-centric power integrity signoff, and hierarchical methods that significantly improve capacity and performance of power integrity (PI) signoff while maintaining a very high level of accuracy at signoff. This blog summarizes the typical design challenges faced by today’s 3D-IC designers, as discussed in our recent webinar, “Addressing 3D-IC Power Integrity Design Challenges.” Please click here to view the full webinar.

Major Trends in Advanced Chip Design

From chips to chiplets, stacked die, 3D-ICs, and more, three major trends are impacting advanced semiconductor packaging design. The first is heterogenous integration, which we define as a disaggregated approach to designing systems on chip (SoCs) from multiple chiplets. This approach is similar to system-in-package (SiP) design, except that instead of integrating multiple bare die – including 3D stacking – on a single substrate, multiple IPs are integrated in the form of chiplets on a single substrate.

The second major trend is around new silicon manufacturing techniques that leverage silicon vias (TSVs) and high-density fanout RDL. These advancements mean that silicon is becoming a more attractive material for packaging, especially when high bandwidth and form factor become key attributes in the end design. This brings new design and verification challenges to most packaging engineers who typically work with organic and ceramic substrate materials.

Finally, on the ecosystem side, all the large semiconductor foundries now offer their own versions of advanced packaging. This brings new ways of supporting design teams with technologies like reference flows and PDKs, concepts that have typically been lacking in the packaging community. Cadence has worked with many of the leading foundries and outsourced semiconductor assembly and test facilities (OSATs) to develop multi-chip(let) packaging reference flows and package assembly design kits. The downside is that, with the time restrictions designers are under today, there isn’t enough time to simulate the details of these flows and PDKs further.

For those who must make the best electro/thermal/physical decisions to achieve the best power/performance/area/cost (PPAC), factors can include accurate die size estimations, thermal feasibility, die-to-die interconnect planning, interposer planning (silicon/organic), front-to-front and front-to-back (F2F/F2B) planning, layer stack and electromigration/ IR drop (EMIR)/TSV planning, IO bandwidth feasibility, and system-level architecture selection.

3D-IC Power Network Design and Analysis

The key to success in 3D-IC design is early power integrity planning and analysis. Cadence’s Integrity 3D-IC platform is a high-capacity 3D-IC platform that enables 3D design planning, implementation, and system analysis in a single, unified cockpit. Cadence’s Voltus IC Power Integrity Solution is a comprehensive full chip electromigration, IR drop, and power analysis solution. With its fully distributed architecture and hierarchical analysis capabilities, Voltus provides very fast analysis and has the capacity to handle the largest designs in the industry. Typically, 3D-IC PDN design and analysis is performed in four phases, as shown in Figure 1.

Phase 1 - Perform early power delivery network (PDN) exploration with each fabric’s PDN cascaded in system PI with early circuit models.

Phase 2 – Plan 3D-IC PDNs in Cadence’s Integrity 3D-IC platform, including micro bumps, TSVs, and through dielectric vias (TDVs), power grid synthesis for dies, and early rail analysis and optimization.

Phase 3 – Perform full chip-centric signoff in Voltus with detailed die, interposer, and package models, including chip die models, while keeping some dies flat.

Phase 4 – Perform full system-level signoff with Cadence’s Sigrity SystemPI using detailed extracted package models from Sigrity XtractIM, board models from Sigrity PowerSI or Clarity 3D Solver, interposer models from XtractIM or Voltus, and chip power models from Voltus.

Figure 1. 3D-IC PDN design and analysis phases

3D-IC Chip-Centric Signoff

The integration of Integrity 3D-IC and Voltus enables chip-centric early analysis and signoff. Figure 2 and Figure 3 highlight the chip centric early PI optimization and signoff flows. In early analysis, the on-chip power networks are synthesized, and the micro bumps and TSVs can be placed and optimized. In the signoff stage, all the detailed design data is used for power analysis, and detailed models are extracted and used for package, interposer, and on-die power networks.

Figure 2. Early chip-centric PI analysis and optimization flow

Figure 3. Chip-centric 3D-IC PI signoff

Hierarchical 3D-IC PI Analysis

To improve the capacity and performance of 3D-IC PI analysis, Voltus enables hierarchical analysis using chiplet models. Chiplet models can be reduced chip models in spice format or more accurate xPGV models which are highly accurate proprietary models generated by Voltus. With xPGV models, the hierarchical PI analysis has almost the same accuracy as flat analysis but offers 10X or higher benefit in runtime and memory requirements.

Conclusion

This blog has highlighted the major design trends enabled by advanced 3D packaging and the design challenges arising from these advancements. The design of power delivery networks is one of these major challenges. We have discussed Cadence solutions to overcome this PI challenge. To learn more, view our recent webinar, "Addressing 3D-IC Power Integrity Design Challenges" and visit the Voltus web page.

When it comes to system integration, PCB designers need to collaborate with the signal analysis or integrity team to run pre-route or post-route analysis and modify constraints, floorplan, or topology based on the results. Allegro PCB Edito...(read more)

The OrCAD X and Allegro X 24.1 release is now available at Cadence Downloads. This blog post provides links to access the release and describes some major changes and new features.   OrCAD X /Allegro X 24.1 (SPB241) Here is a representative li...(read more)

Melika Roshandell, Cadence product marketing director for the Celsius Thermal Solver, recently published an article in Designing Electronics discussing how the use of modern thermal analysis techniques can help engineers meet the challenges of today’s complex electronic designs, which require ever more functionality and performance to meet consumer demand.

Today’s modern electronic designs require ever more functionality and performance to meet consumer demand. These requirements make scaling traditional, flat, 2D-ICs very challenging. With the recent introduction of 3D-ICs into the electronic design industry, IC vendors need to optimize the performance and cost of their devices while also taking advantage of the ability to combine heterogeneous technologies and nodes into a single package. While this greatly advances IC technology, 3D-IC design brings about its own unique challenges and complexities, a major one of which is thermal management.

To overcome thermal management issues, a thermal solution that can handle the complexity of the entire design efficiently and without any simplification is necessary. However, because of the nature of 3D-ICs, the typical point tool approach that dissects the design space into subsections cannot adequately address this need. This approach also creates a longer turnaround time, which can impact critical decision-making to optimize design performance. A more effective solution is to utilize a solver that not only can import the entire package, PCB, and chiplets but also offers high performance to run the entire analysis in a timely manner.

Celsius Thermal Management Solutions

Cadence offers the Celsius Thermal Solver, a unique technology integrated with both IC and package design tools such as the Cadence Innovus Implementation System, Allegro PCB Designer, and Voltus IC Power Integrity Solution. The Celsius Thermal Solver is the first complete electrothermal co-simulation solution for the full hierarchy of electronic systems from ICs to physical enclosures. Based on a production-proven, massively parallel architecture, the Celsius Thermal Solver also provides end-to-end capabilities for both in-design and signoff methodologies and delivers up to 10X faster performance than legacy solutions without sacrificing accuracy.

By combining finite element analysis (FEA) for solid structures with computational fluid dynamics (CFD) for fluids (both liquid and gas, as well as airflow), designers can perform complete system analysis in a single tool. For PCB and IC packaging, engineering teams can combine electrical and thermal analysis and simulate the flow of both current and heat for a more accurate system-level thermal simulation than can be achieved using legacy tools. In addition, both static (steady-state) and dynamic (transient) electrical-thermal co-simulations can be performed based on the actual flow of electrical power in advanced 3D structures, providing visibility into real-world system behavior.

Designers are already co-simulating the Celsius Thermal Solver with Celsius EC Solver (formerly Future Facilities’ 6SigmaET electronics thermal simulation software), which provides state-of-the-art intelligence, automation, and accuracy. The combined workflow that ties Celsius FEA thermal analysis with Celsius EC Solver CFD results in even higher-accuracy models of electronics equipment, allowing engineers to test their designs through thermal simulations and mitigate thermal design risks.

Conclusion

As systems become more densely populated with heat-dissipating electronics, the operating temperatures of those devices impact reliability (device lifetime) and performance. Thermal analysis gives designers an understanding of device operating temperatures related to power dissipation, and that temperature information can be introduced into an electrothermal model to predict the impact on device performance. The robust capabilities in modern thermal management software enable new system analyses and design insights. This empowers electrical design teams to detect and mitigate thermal issues early in the design process—reducing electronic system development iterations and costs and shortening time to market.

To learn more about Cadence thermal analysis products, visit the Celsius Thermal Solver product page and download the Cadence Multiphysics Systems Analysis Product Portfolio.

Live Doc is an advanced automated PCB documentation generation tool integrated with OrCAD X Presto designed to streamline the creation of PCB documentation. By automating the generation of PCB fabrication and assembly drawings, Live Doc significantly...(read more)

Cadence is super excited to announce SPB 23.1 release —Your freedom to design boldly!  

These tools help engineers build better PCBs faster with the new 3D engine and optimized interface.  

We have been hard at work to bring you this release and believe that it will help you take control of the PCB design process with the powerful new features in Allegro X APD like: 

• Packaging Support in 3DX Canvas 

• 3DX Wire DRCs 

• Aligning Components by Offset 

• Text Wizard Enhancements 

• Device File Reuse for Existing Components for Netlist and Logic Import 

Watch this space to know all about What’s New in SPB 23.1.  

Regards 

Team PCBTech 

Cadence Design System 

For individuals, small businesses, or teams, START YOUR FREE TRIAL. 

Does anyone know how to not include a pbar in a constraint manager analysis? I have some relative delay constraints applied on a group of differential nets. When I analyze the design these all show an error. If I delete the plating bar from the design they are all passing. The plating bar gets generated on the Substrate Geometry / Plating_Bar class. I understand that I could just delete the plating bar to verify the constraint but the issue is when I archive this design I would like it to be clean meaning it is in the final state for manufacturing AND passing all constraints according to design reviews.

Anyone have an idea? 

Thank you!