A recording of a training webinar on Microwave Office is available. Topics show the design environment, with special emphasis placed on electromagnetic (EM) simulation. Normal 0 false false false EN-US JA X-NONE ...(read more)

By David Vye, Senior Product Marketing Manager, AWR, Cadence When designing multi-octave high-power amplifiers, it is a challenge to achieve both broadband gain and power matching using a combination of lumped and distributed techniques. One approach...(read more)

Are you ready to revolutionize your RF design experience? Look no further! Cadence AWR software is your gateway to mastering the intricacies of Radio Frequency (RF) circuit design, and now, you can explore its power with our exclusive Free Academic T...(read more)

Hello All:

I am looking for help on the following, as I am new to Cadence tools [I have to use Cadence Innovus for Physical Design after Logic Synthesis using Synopsys Design Compiler, using Nangate 45 nm Open Cell Library]: while using Cadence Innovus, I would need to select a few specific nets to be routed through a specific metal layer. How can I do this on Innovus [are there any command(s)]? Also, would writing and sourcing a .tcl script [containing the command(s)] on the Innovus terminal after the Placement Stage of Physical Design be fine for this?

Secondly, is there a way in Innovus to manipulate layout components, such as changing some pin placements, wire directions (say for example, wire direction changed to facing east from west, etc.) or moving specific closely placed cells around (without violating timing constraints of course) using any command(s)/.tcl script? If so, would pin placement changes and constraining some closely placed cells to be moved apart be done after Floorplanning/Powerplanning (that is, prior to Placement) and the wire direction changes be done after Routing? 

While making the necessary changes, could I use the usual Innovus commands to perform Physical Design of the remaining nets/wires/pins/cells, etc., or would anything need modification for the remaining components as well?

I would finally need to dump the entire design containing all of this in a .def file.

I tried looking up but could only find matter on Virtuoso and SKILL scripting, but I'd be using Innovus GUI/terminal with Nangate 45 nm Open Cell Library. I know this is a lot, but I would greatly appreciate your help. Thanks in advance.

Riya

Dear all, 

I'm trying to perform an LVS check using Calibre between a layout that was generated by Innovus and the initial netlist generated by Genus. However, once I hit Run LVS on Calibre, it reports the following warnings and recommends to stop the process:

Source netlist references but does not define more than 10 subckts:
DFD1BWP7T
DFKCND1BWP7T
DFKCNQD1BWP7T
DFKSND1BWP7T
DFQD1BWP7T
IND2D0BWP7T
INR2D0BWP7T
INVD0BWP7T
INVD2P5BWP7T
IOA21D0BWP7T
... (and more)

If I proceed the LVS process it shows lots of errors as shown in the following image:

Why Genus doesn't include the definition of those sub circuits in the generated netlist? Is this related to Flat/Hierarchy netlisting? 

I have included my Genus scripts as well as the generated netlist in the attachments (and here - if attachment don't work).

Many thanks,

Anas

This document resolved my first query,

Article (11638952) Title: How to output power and ground nets to GDS
URL: support.cadence.com/.../ArticleAttachmentPortal

but now I have 20 power and 20 ground

below is my code

------------------------------------------------
variable GND "vss1" "vss2" "vss3" ... "vss20"
variable VDD "vdd1" "vdd2" "vdd3" ... "vdd20"

select_net M1 GND -outputlayer GND_M1
select_net M2 GND -outputlayer GND_M2
...
select_net AP GND -outputlayer GND_AP

select_net M1 VDD -outputlayer VDD_M1
select_net M2 VDD -outputlayer VDD_M2
...
select_net AP VDD -outputlayer VDD_AP

rule GND{

copy GND_M1
copy GND_M2
...
copy GND_AP}

rule VDD{

copy VDD_M1
copy VDD_M2
...
copy VDD_AP}
------------------------------------------------

I want 20 GND and 20 VDD are separately to highlight,
like this

Can DRC command use for-loop(skill or Tcl) to split the rule?
or how can I do to split it? 
I don't really want to repeat the rule 40 times..haha😅 (use Pegasus 22.21)

I'm currently trying to explore the verilog simulation option in cadence.

One thing that comes to my mind that if there exists a way in cadence workflow to dump selected register/wire's waveform during the simulation. 

Are there any additional tools needed apart from xcelium, is there a tutorial or specific training course for this aspect. I glance through Xcelium Simulator Course Version 22.09, but it seems not having related context. 

I know in Synopsys's workflow, it can be realized using verdi & fsdb in the command line as follows:

if (inst.CTRL_STATE==STATE_START_TO_DUMP)

$fsdbDumpvars(0, inst_1.reg_0);

end

Thanks in advance!

Good morning,
I dug up an old project from 2005 and I should open the schematic to check some things.
This is the schematic of a XILINX XC95108-pq160 CPLD which the XILINX ISE 6.1 software then translated and compiled, to generate a JEDEC file to burn CPLD.

My problem is that I can't open schematics with the versions of Orcad Schematic Entry that I have.
Can anyone help me understand which version of Orcad Schematic Entry I need to install to see these files?

I shared the files on:
drive.google.com/.../view

Thank you very much

Hi, have two designs and would like to copy paste one area of circuit from the old design to the new design, best way/approach and guidance please..

I want to use a transmission gate in my design, but it is not available as a standard cell for Genus RTL synthesis. How can I perform an analysis of area, power, and critical path delay that includes the transmission gate alongside standard cells?

Could you provide guidance or a methodology for integrating custom cells, like the transmission gate, into the synthesis flow for accurate analysis?

I am trying to understand the Linting process. I know that mainly JasperGold is the tool for this purpose. Though I think JasperGold is more suited for later stages of the design. As a RTL Design Engineer, I want to make sure that if another tool has the capability of doing Linting earlier in the flow. for example, does Xcelium, Genus or Confomal support linting. I have seen some contradicting information online regarding this topic, though I can't find anything related to Linting on any of these tools.

Thanks

With the DRAM fabrication advancing from 1x to 1y to 1z and further to 1a, 1b and 1c nodes along with the DRAM device speeds going up to 8533 for Lpddr5/8800 for DDR5, Data integrity is becoming a really important issue that the OEMs and other users have to consider as part of the system that relies on the correctness of data being stored in the DRAMs for system to work as designed.

It’s a complicated problem that requires multiple ways to deal with it.

Traditionally one of the main approaches to deal with data errors is to rely on the ECC. ECC requires additional memory storage in which the ECC codes will calculated and stored at the time of memory write to DRAM. These codes will be read back along with the memory data during to the reads and checked against the data to make sure that there are no errors. Typical ECC schemes use Hamming code that provide for single bit error correction and double bit error detection per burst. Also, while several of previous generation of DRAM required Host to keep aside system memory for ECC storage latest DRAMs like Lpddr5 and DDR5 support on die ECC as part of the normal DRAM function that can be enabled using mode registers. DDR5 further requires Host to run through an ECC Error Check and Scrub (ECS) cycle on an average every tECSint time (Average Periodic ECS Interval) to prevent data errors.

Not meeting the DRAM Refresh requirement is a major reason that can lead to loss of data. This could be challenging as the PVT variation can cause the refresh requirement to change over time. Putting the DRAM in Self Refresh mode can help off-loading Refresh tracking responsibilities to DRAM but may prevent Host to do other scheduling optimizations and should be carefully considered.

Some of the other things that can affect the DRAM data are

1. Row hammer where same or adjacent rows are activated again and again leading to loss or changing of data contents in the rows that has not being addressed. Latest DRAMs like Lpddr5/Ddr5 support Refresh Management (including DRFM and ARFM) that allows the Host to compensate for these problems by issuing dedicated RFM commands helping DRAMs deals with potential Data loss issues arising out of Row hammer attacks.
2. Device temperature is another important factor that the Host needs to be aware of and if the application requires DRAM to operate at elevated temperature. The user needs to check with DRAM Vendor on the temperature range that DRAM can still operate. Data integrity at thresholds greater than certain temperature is not assured regardless of refresh rate unless DRAM is manufactured to withstand that.
3. Loss of power to DRAM will cause DRAM to lose all its contents. If this is a real concern for the system designer, they should consider using NVDIMM-N devices which has an onchip controller and a power source which is just enough to allow the DRAM contents to be copied into a backup non-volatile memory before power is lost. When the power is stored back, the stored memory contents in the non-volatile memory will be written back to the DRAM and system can continue to operate as it was before the power loss event occurred.

For transmissions and manufacturing errors DRAMs support additional features like CRC, DFE, Pre-Emphasis and PPR which will be covered in the next blog.

Cadence MMAV VIPs for DDR5/DDR5 DIMM and LPDDR5 are compressive VIP solutions and supports all of the above-listed Data integrity features including support for ECC error injection and SBE correction/DBE detection to assist with the verification challenges dealing with data integrity issues.

More information on Cadence DDR5/LPDDR5 VIP is available at Cadence VIP Memory Models Website.

Shyam 

The increase in compute and data-intensive applications and the need for lower power consumption have resulted in a rapidly growing number of Arm-based devices in various market segments; this requires fast time to market (TTM) and support for off-t...(read more)

Speed increase requirements keep on flowing by in all the domains surrounding us. The same applies to memory storage too. Earlier mobile devices used eMMC based flash storage, which was a significantly slower technology. With increased SoC processing speed, pairing it with slow eMMC storage was becoming a bottleneck. That is when modern storage technology Universal Flash Storage (UFS) started to gain popularity. 

UFS is a simple and high-performance mass storage device with a serial interface. It is primarily used in mobile systems between host processing and mass storage memory devices. Another important reason for the usage of UFS in mobile systems like smartphones and tablets is minimum power consumption. 

To achieve the highest performance and most power-efficient data transport, JEDEC UFS works in collaboration with industry-leading specifications from the MIPI® Alliance to form its Interconnect Layer. MIPI UniPro is used as a transport layer, and MIPI MPHY is used as a physical layer with the serial DpDn interface. 

UFS 4.0 specification is the latest specification from JEDEC, which leverages UniPro 2.0 and MPHY 5.0 specification standards to achieve the following major improvements:

• Enables up to 4200 Mbps read/write traffic with MPHY 5.0, allowing 23.29 Gbps data rate. 
• High Speed Link Startup, along with Out of Order Data Transfer and BARRIER Command, were introduced to improve system latencies. 
• Data security is enhanced with Advanced RPMB. Advance RPMB also uses the EHS field of the header, which reduces the number of commands required compared to normal RPMB, increasing the bandwidth. 
• Enhanced Device Error History was introduced to ease system integration. 
• File Based Optimization (FBO) was introduced for performance enhancement. 

Along with many major enhancements, UFS 4.0 also maintains backward compatibility with UFS 3.0 and UFS 3.1. 

JEDEC has just announced the UFS 4.0 specification release, quoting Cadence support as a constant contributor in the JEDEC UFS Task Group, actively participating in these specifications development.  

With the availability of the Cadence Verification IP for JEDEC UFS 4.0, MIPI MPHY 5.0 and MIPI UniPro 2.0, early adopters can start working with the provisional specification immediately, ensuring compliance with the standard and achieving the fastest path to IP and SoC verification closure.  

More information on Cadence VIP is available at the Cadence VIP Website. 

Yeshavanth B N 

It has become challenging to ensure that the designs are complete, correct, and adhere to necessary coding rules before handing them off for RTL verification and implementation. RTL Designer Signoff Solution from Cadence helps the user identify RTL bugs at a very early development stage, saving a lot of effort and cost for the design and verification team. Our reputed customers have confirmed that using RTL signoff for their design IP helped save up to 4 weeks and reduce the late-stage RTL changes by up to 80%.(read more)

The rising customer expectations, intermingling fields and high performance needs can be satisfied with the system based design. An intelligent Systems Design strategy can offer a quicker route to an optimum design and helps to increase designers' productivity and analyzes efficiency by providing the ability to explore the entire design space. Cadence Intelligent System Strategy enables a system design revolution and reduces project schedules with optimized continuous integration.(read more)

One of the key goals for USB4 is to retain compatibility with the existing ecosystem of USB3.2, USB 2.0 and Thunderbolt  products, and the resulting connection scales to the best mutual capability of the devices being connected. USB4 is designed to work with older versions of USB and Thunderbolt . USB4 Fabric support high throughput interconnects of 10 Gbps (for Gen 2) and 20 Gbps (for Gen 3) and supports Thunderbolt 3-compatible rates of 10.3125 Gbps (for Gen 2) and 20.625 Gbps (for Gen 3). It becomes very important to verify the Thunderbolt  backward compatibility with the designs. Though the support of USB4 Interoperability with Thunderbolt  3 (TBT3) is optional in USB4 host or USB4 peripheral device and required USB4 Hub and USB4 Based Dock but it is very essential to work in the existing ecosystem. 

Few Main features of USB4 Interoperability with Thunderbolt  3 (TBT3) Systems

• Support for Bi-Directional Pins & Retimers: TBT3 Active Cables can contain two bidirectional Re-timers which have the capability to send AT Responses on its RX channel. Router connected directly to such Retimer needs to support A Router that is connected directly to a bidirectional Re-timer shall support reception of Transactions on both TX and RX channels. 

• Bounce Mechanism: This feature is used by Router to access the Register Space of a Cable Re-timer that can only be accessed by its Link Partner.
• Asymmetric Negotiation: The Router which connects with Cable Retimers needs to follow Asymmetric TxFFE in Phase 5 of Lane Initialization. 
• USB4 Link Transitions: In TBT3 mode, the configuration of two independent Single Lane Links can be used non-transient state or Single Lane Link just using the Lane1 Adapter.

Cadence has a mature USB4 Verification IP solution that can help in the verification of USB4 designs with TBT3. Cadence has taken an active part in the Cairo group that defined the USB4 specification and has created a comprehensive Verification IP that is being used by multiple members. If you plan to have a USB4-compatible design, you can reduce the risk of adopting new technology by using our proven and mature USB4 Verification IP. Please contact your Cadence local account team, for more details.

At what stage in the design cycle do you start to think about the PCB material costs? What about the costs to assemble the PCB? Once a design becomes successful, should you then redesign it to achieve a scalable product? Placing components and routi...(read more)

OrCAD X is the next-generation integrated PCB design platform. It brings to you a powerful cloud-enabled design solution that includes design and library data management integrated with the proven PCB design and analysis product portfolio of Cad...(read more)

Introduction

Multiphysics is an integral part of the concepts around digital twins. In this post, I want to discuss the mechanical aspects of multiphysics in system simulations, which are critical for 3D-IC, multi-die, and chiplet design.

The physical world in which we live is growing ever more electrified. Think of the transformation that the cell phone has brought into our lives, as has the present-day migration to electronic vehicles (EVs). These products are not only feats of electronic engineering but of mechanical as well, as the electronics find themselves in new and novel forms such as foldable phones and flying cars (eVOTLs). Here, engineering domains must co-exist and collaborate to bring about the best end products possible.

Start with the electronics—chips, chiplets, IC packaging, PCB, and modules. But now put these into a new form factor that can be dropped or submerged in water or accelerated along a highway. What about drop testing, aerodynamics, and aeroacoustics? These largely computational fluid dynamics (CFD) and/or mechanical multiphysics phenomena must also be accounted for. And then how does the drop testing impact the electrical performance? The world of electronics and its vast array of end products is pushing us beyond pure electrical engineering to be more broadly minded and develop not only heterogeneous products but heterogeneous engineering teams as well.

Cadence's Unique Expertise

It's at this crossroad of complexity and electronic proliferation that Cadence shines. Let's take, for example, the latest push for higher-performing high-bandwidth memory (HBM) devices and AI data center expansion. These technologies are growing from several layers to 12, and I can't emphasize enough the importance of teamwork and integrated solutions in tackling the challenges of advanced packaging technologies and how collaboration is shaping the future of semiconductor innovation and paving the way for cutting-edge developments in the industry.

These layered electronics are powered, and power creates heat. Heat needs to be understood, and thus, the thermal integrity issues uncovered along the way must be addressed. However, electronic thermal issues are just the first domino in a chain of interdependencies. What about the thermal stress and warpage that can be caused by the powering of these stacked devices? How does that then lend to mechanical stress and even material fatigue as the temperature cycles from high to low and back through the use of the electronic device? This is just one example in a long list of many...

Cadence Multiphysics Analysis Offerings

The confluence of electrical, mechanical, and CFD is exactly why Cadence expanded into multiphysics at a significant rate starting in 2019 with the announcement of the Clarity 3D Solver and Celsius Thermal Solver products for electromagnetic (EM) and thermal multiphysics system simulations. Recent acquisitions of Numeca, Pointwise, and Cascade (now branded within Cadence as the Fidelity CFD Platform) as well as Future Facilities (now the Cadence Reality Digital Twin product line) are all adding CFD expertise. The recent addition of Beta CAE brings mechanical multiphysics to the suite of solutions available from Cadence. The full breadth of these multiphysics system analyses, spanning EM, thermal, signal integrity/power integrity (SI/PI), CFD, and now mechanical, creates a platform for digital twinning across a wide array of applications. You can learn more by viewing Cadence's Reality Digital Twin platform launch on the keynote stage at NVIDIA's GTC in March, as well as this Designed with Cadence video: NV5, NVIDIA, and Cadence Collaboration Optimizes Data Centers.

Conclusion

Ever more sophisticated electronic designs are in demand to fulfill the needs of tomorrow's technologies, driving a convergence of electrical and mechanical aspects of multiphysics in system simulations. To successfully produce the exciting new products of the future, both domains must be able to collaborate effectively and efficiently. Cadence is fully committed to developing and providing our customers with the software products they need to enable this electrical/mechanical evolution. From EM, to thermal, to SI/PI, CFD, and mechanical, Cadence is enabling digital twinning across a wide array of applications that are forging pathways to the future.

For more information on Cadence's multiphysics system analysis offerings, visit our webpage and download our brochure.

Explore Impacts of Finite Interconnect Impedance on PDN Characterization

Over the past few decades, many details have been worked out in the power distribution network (PDN) in the frequency and time domains. We have simulation tools that can analyze the physical structure from DC to very high frequencies, including spatial variations of the behavior. We also have frequency- and time-domain test methods to measure the steady-state and transient behavior of the built-up systems.

All of these pieces in our current toolbox have their own assumptions, limitations, and artifacts, and they constantly raise the challenging question that designers need to answer: How to select the design process, simulation, measurement tools, and processes so that we get reasonable answers within a reasonable time frame with a reasonable budget.

Read this award-winning DesignCon 2024 paper titled “Impact of Finite Interconnect Impedance Including Spatial and Domain Comparison of PDN Characterization.” Led by Samtec’s Istvan Novak and written with a team of nine authors from Cadence, Amazon, and Samtec, the paper discusses a series of continually evolving challenges with PDN requirements for cutting-edge designs.

Read the full paper now: “Impact of Finite Interconnect Impedance Including Spatial and Domain Comparison of PDN Characterization.”

Community engagement is a dynamic concept that does not adhere to a singular, universal approach. Its various forms, methods, and objectives can vary significantly depending on the specific context, goals, and desired outcomes. Whether you seek assis...(read more)

Power network design and analysis of 3D-ICs is a major challenge due to the complex nature and large size of the power network. In addition, designers must deal with the complexity of routing power through the interposer, multiple dies, through-silicon vias (TSVs), and through-dielectric vias (TDVs).
Cadence’s Integrity 3D-IC Platform and Voltus IC Power Integrity Solution provide a fully integrated solution for early planning and analysis of 3D-IC power networks, 3D-IC chip-centric power integrity signoff, and hierarchical methods that significantly improve capacity and performance of power integrity (PI) signoff while maintaining a very high level of accuracy at signoff. This blog summarizes the typical design challenges faced by today’s 3D-IC designers, as discussed in our recent webinar, “Addressing 3D-IC Power Integrity Design Challenges.” Please click here to view the full webinar.

Major Trends in Advanced Chip Design

From chips to chiplets, stacked die, 3D-ICs, and more, three major trends are impacting advanced semiconductor packaging design. The first is heterogenous integration, which we define as a disaggregated approach to designing systems on chip (SoCs) from multiple chiplets. This approach is similar to system-in-package (SiP) design, except that instead of integrating multiple bare die – including 3D stacking – on a single substrate, multiple IPs are integrated in the form of chiplets on a single substrate.

The second major trend is around new silicon manufacturing techniques that leverage silicon vias (TSVs) and high-density fanout RDL. These advancements mean that silicon is becoming a more attractive material for packaging, especially when high bandwidth and form factor become key attributes in the end design. This brings new design and verification challenges to most packaging engineers who typically work with organic and ceramic substrate materials.

Finally, on the ecosystem side, all the large semiconductor foundries now offer their own versions of advanced packaging. This brings new ways of supporting design teams with technologies like reference flows and PDKs, concepts that have typically been lacking in the packaging community. Cadence has worked with many of the leading foundries and outsourced semiconductor assembly and test facilities (OSATs) to develop multi-chip(let) packaging reference flows and package assembly design kits. The downside is that, with the time restrictions designers are under today, there isn’t enough time to simulate the details of these flows and PDKs further.

For those who must make the best electro/thermal/physical decisions to achieve the best power/performance/area/cost (PPAC), factors can include accurate die size estimations, thermal feasibility, die-to-die interconnect planning, interposer planning (silicon/organic), front-to-front and front-to-back (F2F/F2B) planning, layer stack and electromigration/ IR drop (EMIR)/TSV planning, IO bandwidth feasibility, and system-level architecture selection.

3D-IC Power Network Design and Analysis

The key to success in 3D-IC design is early power integrity planning and analysis. Cadence’s Integrity 3D-IC platform is a high-capacity 3D-IC platform that enables 3D design planning, implementation, and system analysis in a single, unified cockpit. Cadence’s Voltus IC Power Integrity Solution is a comprehensive full chip electromigration, IR drop, and power analysis solution. With its fully distributed architecture and hierarchical analysis capabilities, Voltus provides very fast analysis and has the capacity to handle the largest designs in the industry. Typically, 3D-IC PDN design and analysis is performed in four phases, as shown in Figure 1.

Phase 1 - Perform early power delivery network (PDN) exploration with each fabric’s PDN cascaded in system PI with early circuit models.

Phase 2 – Plan 3D-IC PDNs in Cadence’s Integrity 3D-IC platform, including micro bumps, TSVs, and through dielectric vias (TDVs), power grid synthesis for dies, and early rail analysis and optimization.

Phase 3 – Perform full chip-centric signoff in Voltus with detailed die, interposer, and package models, including chip die models, while keeping some dies flat.

Phase 4 – Perform full system-level signoff with Cadence’s Sigrity SystemPI using detailed extracted package models from Sigrity XtractIM, board models from Sigrity PowerSI or Clarity 3D Solver, interposer models from XtractIM or Voltus, and chip power models from Voltus.

Figure 1. 3D-IC PDN design and analysis phases

3D-IC Chip-Centric Signoff

The integration of Integrity 3D-IC and Voltus enables chip-centric early analysis and signoff. Figure 2 and Figure 3 highlight the chip centric early PI optimization and signoff flows. In early analysis, the on-chip power networks are synthesized, and the micro bumps and TSVs can be placed and optimized. In the signoff stage, all the detailed design data is used for power analysis, and detailed models are extracted and used for package, interposer, and on-die power networks.

Figure 2. Early chip-centric PI analysis and optimization flow

Figure 3. Chip-centric 3D-IC PI signoff

Hierarchical 3D-IC PI Analysis

To improve the capacity and performance of 3D-IC PI analysis, Voltus enables hierarchical analysis using chiplet models. Chiplet models can be reduced chip models in spice format or more accurate xPGV models which are highly accurate proprietary models generated by Voltus. With xPGV models, the hierarchical PI analysis has almost the same accuracy as flat analysis but offers 10X or higher benefit in runtime and memory requirements.

Conclusion

This blog has highlighted the major design trends enabled by advanced 3D packaging and the design challenges arising from these advancements. The design of power delivery networks is one of these major challenges. We have discussed Cadence solutions to overcome this PI challenge. To learn more, view our recent webinar, "Addressing 3D-IC Power Integrity Design Challenges" and visit the Voltus web page.

When it comes to system integration, PCB designers need to collaborate with the signal analysis or integrity team to run pre-route or post-route analysis and modify constraints, floorplan, or topology based on the results. Allegro PCB Edito...(read more)

The OrCAD X and Allegro X 24.1 release is now available at Cadence Downloads. This blog post provides links to access the release and describes some major changes and new features.   OrCAD X /Allegro X 24.1 (SPB241) Here is a representative li...(read more)

Melika Roshandell, Cadence product marketing director for the Celsius Thermal Solver, recently published an article in Designing Electronics discussing how the use of modern thermal analysis techniques can help engineers meet the challenges of today’s complex electronic designs, which require ever more functionality and performance to meet consumer demand.

Today’s modern electronic designs require ever more functionality and performance to meet consumer demand. These requirements make scaling traditional, flat, 2D-ICs very challenging. With the recent introduction of 3D-ICs into the electronic design industry, IC vendors need to optimize the performance and cost of their devices while also taking advantage of the ability to combine heterogeneous technologies and nodes into a single package. While this greatly advances IC technology, 3D-IC design brings about its own unique challenges and complexities, a major one of which is thermal management.

To overcome thermal management issues, a thermal solution that can handle the complexity of the entire design efficiently and without any simplification is necessary. However, because of the nature of 3D-ICs, the typical point tool approach that dissects the design space into subsections cannot adequately address this need. This approach also creates a longer turnaround time, which can impact critical decision-making to optimize design performance. A more effective solution is to utilize a solver that not only can import the entire package, PCB, and chiplets but also offers high performance to run the entire analysis in a timely manner.

Celsius Thermal Management Solutions

Cadence offers the Celsius Thermal Solver, a unique technology integrated with both IC and package design tools such as the Cadence Innovus Implementation System, Allegro PCB Designer, and Voltus IC Power Integrity Solution. The Celsius Thermal Solver is the first complete electrothermal co-simulation solution for the full hierarchy of electronic systems from ICs to physical enclosures. Based on a production-proven, massively parallel architecture, the Celsius Thermal Solver also provides end-to-end capabilities for both in-design and signoff methodologies and delivers up to 10X faster performance than legacy solutions without sacrificing accuracy.

By combining finite element analysis (FEA) for solid structures with computational fluid dynamics (CFD) for fluids (both liquid and gas, as well as airflow), designers can perform complete system analysis in a single tool. For PCB and IC packaging, engineering teams can combine electrical and thermal analysis and simulate the flow of both current and heat for a more accurate system-level thermal simulation than can be achieved using legacy tools. In addition, both static (steady-state) and dynamic (transient) electrical-thermal co-simulations can be performed based on the actual flow of electrical power in advanced 3D structures, providing visibility into real-world system behavior.

Designers are already co-simulating the Celsius Thermal Solver with Celsius EC Solver (formerly Future Facilities’ 6SigmaET electronics thermal simulation software), which provides state-of-the-art intelligence, automation, and accuracy. The combined workflow that ties Celsius FEA thermal analysis with Celsius EC Solver CFD results in even higher-accuracy models of electronics equipment, allowing engineers to test their designs through thermal simulations and mitigate thermal design risks.

Conclusion

As systems become more densely populated with heat-dissipating electronics, the operating temperatures of those devices impact reliability (device lifetime) and performance. Thermal analysis gives designers an understanding of device operating temperatures related to power dissipation, and that temperature information can be introduced into an electrothermal model to predict the impact on device performance. The robust capabilities in modern thermal management software enable new system analyses and design insights. This empowers electrical design teams to detect and mitigate thermal issues early in the design process—reducing electronic system development iterations and costs and shortening time to market.

To learn more about Cadence thermal analysis products, visit the Celsius Thermal Solver product page and download the Cadence Multiphysics Systems Analysis Product Portfolio.

Cadence is super excited to announce SPB 23.1 release —Your freedom to design boldly!  

These tools help engineers build better PCBs faster with the new 3D engine and optimized interface.  

We have been hard at work to bring you this release and believe that it will help you take control of the PCB design process with the powerful new features in Allegro X APD like: 

• Packaging Support in 3DX Canvas 

• 3DX Wire DRCs 

• Aligning Components by Offset 

• Text Wizard Enhancements 

• Device File Reuse for Existing Components for Netlist and Logic Import 

Watch this space to know all about What’s New in SPB 23.1.  

Regards 

Team PCBTech 

Cadence Design System 

For individuals, small businesses, or teams, START YOUR FREE TRIAL. 

Does anyone know how to not include a pbar in a constraint manager analysis? I have some relative delay constraints applied on a group of differential nets. When I analyze the design these all show an error. If I delete the plating bar from the design they are all passing. The plating bar gets generated on the Substrate Geometry / Plating_Bar class. I understand that I could just delete the plating bar to verify the constraint but the issue is when I archive this design I would like it to be clean meaning it is in the final state for manufacturing AND passing all constraints according to design reviews.

Anyone have an idea? 

Thank you!

Starting SPB 23.1, in Allegro X PCB Editor and Allegro X Advanced Package Designer, you can align components by using offset mode. Earlier only spacing mode was available.

Follow these steps to Align Components using Offset Mode:

1. Set Application Mode to Placement Edit.
2. Drag the components that need to be aligned and right-click and choose Align Components.
3. Now, in the Options tab, you will notice Spacing Section with Equal Offset. You can equally and individually offset the components by using the +/- buttons for increment or decrement.

Starting SPB 23.1, Allegro Package Designer Plus (APD+) has been rebranded as Allegro X Advanced Package Designer (Allegro X APD).

The splash screen for Allegro X APD will appear as shown below, instead of showing APD+ 2023:

For the Windows Start menu in 23.1, it will display as Allegro X APD 2023 instead of APD+ 2023, as shown below

23.1 Start menu 

In the Product Choices window for 23.1, you will see Allegro X Advanced Package Designer in the place of Allegro Package Designer +, as shown below: 

23.1 product title

Have you heard that starting SPB 23.1, Allegro Package Designer Plus (APD+) will be renamed as Allegro X Advanced Package Designer (Allegro X APD)? 

Allegro X APD offers multiple new features and enhancements on topics like Via Structures, Wirebond, Etchback, Text Wizards, 3D Canvas, and more. 

This post presents the new 3DX Canvas introduced in SPB 23.1. This can be invoked from Allegro X APD (from the menu item View > 3DX Canvas). 

Some of the key benefits of the new canvas: 

• This canvas addresses the scale and complexity in large modern package designs. It provides highly efficient visual representation and implementation of packages. 
  
• The new architecture enables high-performance 3D incremental updates by utilizing GPU for fast rendering. 
  
  
• Real-time 3D incremental updates are supported, which means that the 3D view is in sync with all changes to the database. 
  
  
• The new canvas provides 3D visualization support for packaging objects such as wire bonds, ball, die bump/pillar geometries, die stacks, etch back, and plating bar. 
  
  
• This release also introduces the interactive measurement tool for a 3D view of packages. Once you open 3DX Canvas, press the Alt key and you can select the objects you want to measure. 
  
• 3DX Canvas provides new 3D DRC Bond Wire Clearances with Real 3D DRC Checks. True 3D DRC in Constraint Manager has been introduced. If you open Constraint Manager, there will be a new worksheet added. Following DRC checks are supported: 

  Wire to Wire 
  Wire to Finger 
  Wire to Shape 
  Wire to Cline 
  Wire to Component

Have you ever encountered ERROR(SPMHNI-67) while importing logic? If yes, you might already know that you had to export libraries of the design and make sure that paths (devpath, padpath, and psmpath) include the location of exported files.  

Starting in SPB23.1, if you go to File > Import > Logic/Netlist and click on the Other tab, you will see an option, Reuse device files for existing components. 

After selecting this option, ERROR(SPMHNI-67) will no longer be there in the log file, because the tool will automatically extract device files and seamlessly use them for newly imported data. In other words, SPB_23.1 lets you reuse the device / component definitions already in the design without first having to dump libraries manually. An excellent improvement, don’t you think?  

Hi，

I want to delete via use skill，but i dont write this skill. can you help me.

This skill has Interactive interface，the interface can imput  Select Net and select padstack；

I can  use temp group to select the via；

example，i want to delete via，the padstack is L1:L3，the net is vss. i can imput padstack  L1:L3 and select net: VSS；

Note: The green is VSS，the padstack L1:L3 and L3:L5 ；

thanks

In a package design, designers often need to perform degassing. This is typically done at the end of the design process before sending the design to the manufacturer.

Degassing is a process where you perforate power planes, voltage planes, and filled shapes in your design. Degassing holes let the gas escape from beneath the metal during manufacturing of the substrate. The perforations or holes for degassing are generally small, having a specified size and shape, and are spaced regularly across the surface of the plane. If the degassing process is not done, it may result in the formation of gas bubbles under the metal, which may cause the surface of the metal to become uneven. After you degas the design, it is recommended to perform electrical verification.

Allegro X APD has degassing features that allow users to automate the process and place holes in the entire shape.

In today’s topic, we will talk about how to avoid adding  degassing holes on a particular shape.

Sometimes, a designer may need to avoid adding degassing holes to a particular shape on a layer. All other shapes on the layer can have degassing holes but not this shape. Using the Layer Based Degassing Parameters option, the designer can set the degassing parameters for all shapes on the layer. Now, the designer would like to defer adding degassing holes for this particular shape.

You may wonder if there is an easy way to achieve this. We will now see how this can be done with the tool.

Once the degassing parameters are set, performing Display > Element on any of the shapes on that layer will show the degassing parameters set.

You can apply the Degas_Not_Allowed property to a shape to specify that degassing should not be performed on this shape, even if the degassing requirements are met. Select the shape and add the property as shown below.

Switch to Shape Edit application mode (Setup > Application mode > Shape Edit) and window-select all shapes on the layer. Then, right-click and select Deferred Degassing > All Off.

Now, all shapes on the layer will have degassing holes except for the shape which has the Degas_Not_Allowed property attached to it.

By default, a dielectric must separate each pair of conductor layers in the cross-section of a design. In rare cases, this does not represent the real, manufactured substrate.

If your design requires you to have conductor layers that are not separated by a dielectric (such as, for half-etch designs), there is a variable that needs to be set in Allegro X APD. You must set this by enabling the variable icp_allow_adjacent_conductors. This entry, and its location in the User Preferences Editor, are shown in the following image.

The Objects on adjacent conductor layers do not electrically connect together, automatically. A via must be used to establish the inter-layer connections.

When enabling this option, it is recommended to exercise caution because excluding dielectric layers from your cross-section can lead to inaccurate calculations, including the calculations for signal integrity and via heights. It is important that your cross-section accurately reflect the finished product to ensure the most accurate results possible. Any dielectric layers present in the manufactured part need to be in the cross-section for accurate extraction, 3D viewing, and so on.

Let us know your comments on the various designs that would require adjacent conductor layers.

Hi，

Can you tell me which setting is causing this?

In the general edit. I try slide via to other position. but the slide is wrong.

in the cm，i set pad-pad connect is all allowed，and i turn off via to pad spacing in the same net spacing. only turn on via to via spacing in the same net spacing，set to via to via spacing =0.

default the via is closer to the pad edge, I think the correct location is show in the pic2.

Power and Ground rings are exposed rings of metal surrounding a die that supply power/ground to the die and create a low-impedance path for the current flow. These rings ensure stable power distribution and reduce noise. Allegro X Package Designer Plus has a utility called Power/Ground Ring Generator which lets you define and place one or more shapes in the form of a ring around a die.

 To run the PWR/GND Generator Wizard, go to Route > Power/Ground Ring Generator or type "pring wizard" in the APD command window to invoke the Wizard.

This Wizard lets you define and place one or more shapes in the form of a ring around a die. The Power/Ground Ring Wizard creates up to 12 rings (shapes) at a time. If you require more rings, you can run the Power/Ground Ring Wizard as many times as needed. This command displays a wizard in which you can specify:

• The number of rings to be generated
• The creation of the first ring as a die flag (Die flag is the boundary of the die like the power ring.)
  • If you create a die flag and the first ring is the same net as the flag, you can enter a negative distance to overlap the ring and the die flag.
• Multiple options for placement of the rings with respect to:
  • Origination point
  • Distance from the edge of the die
  • Distance from the nearest die pin on each die side
• The reference designator of the die with which the rings will be used
• The distance between rings
• The width of each ring
• The corner types on each ring (arc, chamfer, and right-angle)
• An assigned net name for each ring
• A label for each ring

The rings are basic in nature. For other shape geometries or split rings, choose Shape > Polygon or Shape > Compose/Decompose Shape from the menu in the design window.

Depending on the options selected, the Power/Ground Ring Wizard UI changes, representing how the rings will be created. Verify the Wizard settings to ensure that the rings are created as intended.

1. When the Power/Ground Ring Wizard appears, set the number of rings to 2, accept the other defaults, and click Next. You can set Create first ring as die flag to create a basic die flag.

         2. Define Ring 1 and the net associated with it.

              a) Browse and choose Vss in the Net Names dialog box.

            b) Click OK.

            c) Specify the label as VSS.

            d) Click Next.

             The first ring should appear in your design. It is associated with the proper net; in this case, VSS.

2. For the second ring, choose the net as Vdd and specify the label as VDD.
3. Click Next.
4. Click Finish in the Result Verification screen to complete the process.

The completed rings appear as shown below.

Now, when you click on Power and Ground Die Pin and add wirebonds, you will see that the wirebonds are placed directly on the Power and Ground rings.

Hello, SKILL experts. 

I'm studying SKILL language to build some useful function in APD+.

Now, I want to execute 'Import Sub-drawing' function in new form.

But I cannot find how to do execute APD+ embedded function in a field of new form. 

Has anyone experienced this or idea to solve this problem? 

When things go wrong with your package design flow, it can sometimes be difficult to understand the cause of the issue. This can be something like a die component is wrongly identified as a BGA, a via stack has an alignment issue, or there are duplicate bondwires. These are just a few examples of issues; there can be many more. When interactive messages and log files do not help determine the problem, the Package Design Integrity Check tool becomes very handy. This feature lets you run integrity checks, which ensures that the database is configured correctly. 

To invoke the command from Allegro X Advanced Package Designer, use the Tools > Package Design Integrity menu. 

Or type package integrity at the Command  prompt. 

The Package Design Integrity Checks dialog box includes all categories and checks currently registered for the currently running product. You can enable all these categories and checks or only the one that you want to run. This utility can fix errors automatically (where possible). Errors and warnings are written to the “package_design_check.log” file.  

The utility can also be extended with your own custom rules based on your specific flows and needs. 

Cadence PCIe/CXL VIP support for Partial Header Encryption in Integrity and Data Encryption.(read more)

Verisium Debug, the Cadence unified debug platform, offers a variety of debugging capabilities, including RTL debug, UVM testbench debug, UPF debug, and DMS debug. From IP to SoC level debug, the user can take the benefits of the rich debugging features to reduce the time for debug.

Not only the common and advanced debug features, Verisium Debug also provides Python-based interface API, which enables capabilities allowing users to customize functions with Verisium Debug Python API to access from design, waveform databases and add functions to Verisium Debug’s GUI for visualization purposes. With Verisium Debug’s Python API, users can turn repetitive works into automatic programs or reduce efforts to create in-house utilities with well-established infrastructure from Verisium Debug.

Here is an example of how the user uses Python API to create a customized function. Users can write a Python program to extract signals in a specific design scope and report the values of the extracted signals. From Fig 1., you can understand the procedure of the traversal steps.

1. Import Python library in Verisium Debug package.
2. Setup the database for traversal.
3. Search the scope with the hierarchy information in the design DB.
4. Query the signal list and the values of the signals.
5. Print out the results.

Fig 1. Procedure of Verisium Debug Python Program

The result from the Verisium Debug Python App can be used for post-process design checking or fed into other utilities in the design flow.

The concept is very straightforward. With Verisium Debug and the Python API environment enabled, you can easily query any information that is stored in the databases of Verisium Debug. The result can be outputted in text format, or you can also use the API to display the results back to Verisium Debug’s GUI.

The Verisium Debug Python API is an important capability and resource for Verisium Debug users. To make Verisium Debug Python API easier to access, from Verisium Debug 24.10 release, Verisium Debug introduced the new Verisium Debug Python App Store.

Fig 2. Verisium Debug App Store

The Python App Store includes ready-to-use Python App examples with the availabilities of original source code documents, which help the user to understand how to start writing an app that fits their use case.

Fig 3. Example apps in Verisium Debug App Store

The Verisium Debug Python App Store can also be used by a team as an app management system. App creators can share the developed apps across teams within their companies. The in-house created apps will become easy to manage, and engineers can easily access the apps from the central location, which makes it possible for users to see the updated available Verisium Debug Apps from the Verisium Debug App Store.

Check the following videos for more information about Verisium Debug Python API:

Customize Verisium Debug with Python API

Verisium Debug Customized Apps with Python API

The application of real-time data processing or responsiveness is crucial, such as in high-performance computing, data centers, or applications requiring low-latency data transfers. It enables efficient use of PCIe bandwidth and resources by intelligently managing memory write operations based on system dynamics and workload priorities. By effectively leveraging Deferrable Memory Write [DMWr], Devices can achieve optimized performance and responsiveness, aligning with the evolving demands of modern computing applications.

What Is Deferrable Memory Write?

Deferrable Memory Write (DMWr) ECN introduced this new memory transaction type, which was later officially incorporated in PCIe 5.0 to CXL2.0. This enhanced type of memory transaction is Deferrable Memory Write [DMWr], which flows as another type of existing Read/Write memory transaction; the major difference of this Deferrable Memory Write, where the Requester attempts to write to a given location in Memory Space using the non-posted DMWr TLP Type, it Postponing their completion of memory write transactions to improve overall system efficiency and performance, those memory write operation can be delay or deferred until other priority task complete.

The Deferrable Memory Write (DMWr) requires the Completer to return an acknowledgment to the Requester and provides a mechanism for the recipient to defer (temporarily refuse to service) the Request.

DMWr provides a mechanism for Endpoints and hosts to choose to carry out or defer incoming DMWr Requests. This mechanism can be used by Endpoints and Hosts to simplify the design of flow control, reduce latency, and improve throughput. The Deferrable Memory writes TLP format in Figure A.

(Fig A) Deferrable Memory writes TLP format.

Example Scenario

Here's how the DMWr works with a simplified example: Imagine a system with an endpoint device (Device A) and a host CPU (Device B). Device B wants to write data to Device A's memory, but due to varying reasons such as system bus congestion or prioritization of other transactions, Device A can defer the completion of the memory write request. Just follow these steps:

1. Initiation of Memory Write: Device B initiates a memory write transaction to Device A. This involves sending the memory write request along with the data payload over the PCIe physical layer link.
2. Acknowledgment and Deferral: Upon receiving the memory write request, Device A acknowledges the transaction but may decide to defer its completion. Device A sends an acknowledgment (ACK) back to Device B, indicating it has received the data and intends to complete the write operation but not immediately.
3. Deferred Completion: Device A defers the completion of the memory write operation to a later, more opportune time. This deferral allows Device A to prioritize other transactions or optimize the use of system resources, such as memory bandwidth or processor availability.
4. Completion and Response: At a later point, Device A completes the deferred memory write operation and sends a completion indication back to Device B. This completion typically includes any status updates or additional information related to the transaction.

Usage or Importance of DMWr

Deferrable Memory Write usage provides the improvement in the following aspects:

• Reduced Latency: By deferring less critical memory write operations, more critical transactions can be processed with lower latency, improving overall system responsiveness.
• Improved Efficiency: Optimizes the utilization of system resources such as memory bandwidth and CPU cycles, enhancing the efficiency of data transfers within the PCIe architecture.
• Enhanced Performance: Allows devices to manage and prioritize transactions dynamically, potentially increasing overall system throughput and reducing contention.

Challenges in the Implementation of DMWr Transactions

The implementation of deferrable memory writes (DMWr) introduces several advancements and challenges in terms of usage and verification:

1. Timing and Synchronization: DMWr allows transactions to be deferred, complicating timing requirements or completing them within acceptable timing windows to avoid protocol violations. Ensuring proper synchronization between devices becomes critical to prevent data loss or corruption.
2. Protocol Compliance: Verification must ensure compliance with ECN PCIe 6.0 and CXL specifications regarding when and how DMWr transactions can be initiated and completed.
3. Performance Optimization: While DMWr can improve overall system performance by reducing latency, verifying its impact on system performance and ensuring it meets expected benchmarks is crucial.
4. Error Handling: Handling errors related to deferred transactions adds complexity. Verifying error detection and recovery mechanisms under various scenarios (e.g., timeout during deferral) is essential.

Verification Challenges of DMWr Transactions

The challenges to verifying the DMWr transaction consist of all checks with respect to Function, Timing, Protocol compliance, improvement, Error scenario, and security usage on purpose, as well as Data integrity at the PCIe and CXL.

1. Functional Verification: Verifying the correct implementation of DMWr at both ends of the PCIe link (transmitter and receiver) to ensure proper functionality and adherence to specifications.
2. Timing Verification: Validating timing constraints associated with deferring writes and ensuring transactions are completed within specified windows without violating protocol rules.
3. Protocol Compliance Verification: Checking that DMWr transactions adhere to PCIe and CXL protocol rules, including ordering rules and any restrictions on deferral based on the transaction type.
4. Performance Verification: Assessing the impact of DMWr on overall system performance, including latency reduction and bandwidth utilization, through simulation and testing.
5. Error Scenario Verification: Creating and testing scenarios to verify error handling mechanisms related to DMWr, such as timeouts, retries, and recovery procedures.
6. Security Considerations: Assessing potential security vulnerabilities related to DMWr, such as data integrity risks during deferred transactions or exposure to timing-based attacks.

Major verification challenges and approaches are timing and synchronization verification in the context of implementing deferrable memory writes (DMWr), which is crucial due to the inherent complexities introduced by deferred transactions. Here are the key issues and approaches to address them:

Timing and Synchronization Issues

1. Transaction Completion Timing:
   • Issue: Ensuring deferred transactions are completed within the specified time window without violating protocol timing constraints.
   • Approach: Design an internal timer and checker to model worst-case scenarios where transactions are deferred and verify that they are complete within allowable latency limits. This involves simulating various traffic loads and conditions to assess timing under different scenarios.
2. Ordering and Dependencies:
   • Issue: Verifying that transactions deferred using DMWr maintain the correct ordering and dependencies relative to non-deferred transactions.
   • Approach: Implement test scenarios that include mixed traffic of DMWr and non-DMWr transactions. Verify through simulation or emulation that dependencies and ordering requirements are correctly maintained across the PCIe link.
3. Interrupt Handling and Response Times:
   • Issue: Verify the handling of interrupts and ensure timely responses from devices involved in DMWr transactions.
   • Approach: Implement test cases that simulate interrupt generation during DMWr transactions. Measure and verify the response times to interrupts to ensure they meet system latency requirements.

In conclusion, while deferrable memory writes in PCIe and CXL offer significant performance benefits, their implementation and verification present several challenges related to timing, protocol compliance, performance optimization, and error handling. Addressing these challenges requires rigorous testing and testbench of traffic, advanced verification methodologies, and a thorough understanding of PCIe specifications and also the motivation behind introducing this Deferrable Write is effectively used in the CXL further. Outcomes of Deferrable Memory Write verify that the performance benefits of DMWr (reduced latency, improved throughput) are achieved without compromising timing integrity or violating protocol specifications.

In summary, PCIe and CXL are complex protocols with many verification challenges. You must understand many new Spec changes and consider the robust verification plan for the new features and backward compatible tests impacted by new features. Cadence's PCIe 6.0 Verification IP is fully compliant with the latest PCIe Express 6.0 specifications and provides an effective and efficient way to verify the components interfacing with the PCIe 6.0 interface. Cadence VIP for PCIe 6.0 provides exhaustive verification of PCIe-based IP and SoCs, and we are working with Early Adopter customers to speed up every verification stage.

More Information

• For more info on how Cadence PCIe Verification IP and TripleCheck VIP enable users to confidently verify PCIe 6.0, see our VIP for PCI Express, VIP for Compute Express Link, and TripleCheck for PCI Express
• See the PCI-SIG website for more details on PCIe in general and the different PCI standards.

Cadence Protium prototyping platforms rapidly bring up an SoC or system prototype and provide a pre-silicon platform for early software development, SoC verification, system validation, and hardware regressions. In this Training W ebinar, we will explore debugging using Save/Restart on Protium X2 . This feature saves execution time and lets you focus on actual debugging. The system state can be saved before the bug appears and restartS directly from there without spending time in initial execution. We’ll cover key concepts and applications, explore Save/Restart performance metrics, and provide examples to help you understand the concepts. Agenda: The key concepts of debugging using save/restart Capabilities, limitations, and performance metrics Some examples to enable and use save/restart on the Protium X2 system Date and Time Thursday, November 7, 2024 07:00 PST San Jose / 10:00 EST New York / 15:00 GMT London / 16:00 CET Munich / 17:00 IST Jerusalem / 20:30 IST Bangalore / 23:00 CST Beijing REGISTER To register for this webinar, sign in with your Cadence Support account (email ID and password) to log in to the Learning and Support System*. Then select Enrol to register for the session. Once registered, you’ll receive a confirmation email containing all login details. A quick reminder: If you haven’t received a registration confirmation within 1 hour of registering, please check your spam folder and ensure your pop-up blockers are off and cookies are enabled. For issues with registration or other inquiries, reach out to eur_training_webinars@cadence.com . Want to See More Webinars? You can find recordings of all past webinars here Like This Topic? Take this opportunity and register for the free online course related to this webinar topic: Protium Introduction Training The course includes slides with audio and downloadable lab exercises designed to emphasize the topics covered in the lecture. There is also a Digital Badge available for the training. Want to share this and other great Cadence learning opportunities with someone else? Tell them to subscribe . Hungry for Training? Choose the Cadence Training Menu that’s right for you. To view our complete training offerings, visit the Cadence Training website . Related Courses Protium Introduction Training Course | Cadence Palladium Introduction Training Course | Cadence Related Blogs Training Insights – A New Free Online Course on the Protium System for Beginner and Advanced Users Training Insights – Palladium Emulation Course for Beginner and Advanced Users Related Training Bytes Protium Flow Steps for Running Design on Protium System ICE and IXCOM mode comparison ICE compile flow IXCOM compile flow PATH settings for using Protium System Please see the course learning maps for a visual representation of courses and course relationships. Regional course catalogs may be viewed here

This November, the engineering and simulation community is set to converge in China for an event that promises to be nothing short of revolutionary. The 2024 BETA CAE Systems China Open Meeting, taking place in the vibrant cities of Beijing and Shanghai on November 5 and 7 , respectively, is a must-attend for anyone looking to stay at the forefront of technological innovation in simulation solutions. Prepare to be inspired by Ben Gu , the visionary Corporate VP of Research and Development at Cadence. He will lead both meetings in Beijing and Shanghai with his keynote on " A New Millennium in Multiphysics System Analysis ." This thought-provoking keynote is expected to provide attendees with a glimpse into the future of engineering simulation and analysis. What sets the BETA CAE Systems Open Meetings apart is not just the high caliber of speakers but also the hands-on training sessions designed to enhance your technical expertise with the BETA CAE software suite. Whether you are an inexperienced individual seeking to acquire fundamental knowledge or an accomplished professional endeavoring to hone your expertise, these training sessions following the open meetings are meticulously tailored to meet your needs. Join Us at the BETA CAE Systems Open Meeting in Beijing The BETA CAE Systems Open Meeting in Beijing will feature a keynote speech by Peng Qiao , Senior Engineer at Great Wall Motors Co., Ltd, on Multidisciplinary Optimization Techniques for Automotive Control Arms . ( View detailed agenda for Beijing. ) When: November 5, 2024 Where: Grand Metropark Hotel Beijing If this sounds interesting, register today for the BETA CAE Systems Beijing Open Meeting by clicking the button below. Don't Miss Out on the BETA CAE Systems Open Meeting in Shanghai After the BETA CAE Systems Open Meeting in Beijing, the next meeting in China will be in Shanghai. During this event, Liu Deping, CAE Engineer from Zhejiang Geely Automobile Research Institute Co., Ltd, will deliver a keynote speech on the Application of ANSA in the Simulation Development Cycle . ( View detailed agenda for Shanghai. ) When: November 7, 2024 Where: InterContinental Shanghai Jing'an Following the open meeting on November 7 will be an exclusive training day on November 8. This session will provide attendees with practical experience using the BETA CAE software to improve their technical skills and provide hands-on knowledge of the software. If you find this intriguing, register now for the BETA CAE Systems Shanghai Open Meeting by clicking the button below. Why Attend? Gain firsthand insights into the latest developments in simulation technology Learn from real-world applications and success stories from various industries Connect and exchange ideas with experts in a collaborative environment Mark your calendars for this unparalleled opportunity to explore the forefront of simulation technology. Whether you're aiming to broaden your knowledge, enhance your technical skills, or connect with industry leaders, the BETA CAE Systems Open Meetings are your gateway to the future of engineering. Join us and be part of shaping the next wave of innovation in the simulation world.

Wild River Technology (WRT), the leading supplier of signal integrity measurement and optimization test fixtures for high-speed channels at data rates of up to 224G, has announced the availability of a new advanced channel modeling solution that helps achieve extreme signal integrity design to 70GHz. Read the press release. The CMP-70 program continues the industry-first simulation-to-measurement collaboration with Cadence that was initially established with the CMP-50. Significant resources were dedicated to the development of the CMP-70 by Cadence and WRT over almost three years. The CMP-70 will be on display at DesignCon 2025 , January 28-30, in Cadence booth 827 to benchmark the Cadence Clarity 3D Solver . “I am not a fan of hype-based programs that simply get attention,” remarked Alfred P. Neves, WRT’s co-founder and chief technical officer. “Both Cadence and Wild River brought substantial skills to the table in this project as we continued our industry-first simulation-to-measurement collaboration. The result is a proven, robust and accurate platform that brings extreme signal integrity to 70GHz designs. This application package has also been instrumental in demonstrating the robust 3D EM simulation capability of the Cadence Clarity solver.” “We’re delighted to continue the joint development and validation program with WRT that started with the CMP-50,” said Gary Lytle, product management director at Cadence. “The skilled and experienced signal integrity technologists that both companies bring to the program results in a superior signal integrity solution for our mutual customers.” CMP-70 Solution Features The solution is available both in a standard configuration and as a custom solution for customer-specific stackups and fabrication. The primary target application is to support a 3D EM solver analysis modeling versus the time- and frequency-domain measurement methodologies. The solution features include: The CMP-70 platform, assembled and 100% TDR NIST traceable tested, with custom stands Material Identification overview web-based meeting including anisotropic 3D material identification A cross-section PCB report and structures for using as-fabricated geometries Measured S-parameters, pre-tested for quality (passivity/causality and resampled for time domain simulations) A host of novel crosstalk structures suited for 112G HD level project analysis PCB layout design files (NDA required) An EDA starter library including loss models with industry-first accurate surface roughness models Comprehensive training available for 3D EM analysis – correspondence, material ID in X-Y and Z axis for a host of EDA tools Industry-First Hausdorff Technique The WRT application package also includes an industry-first modified Hausdorff (MHD) technique , included as MATLAB code. This algorithmic approach provides an accurate way to compare two sets of measurements in multi-dimensional space to determine how well they match. The technique is used to compare the results simulated by the Clarity solver with those measured on the CMP-70 platform. The methodology and initial results are shown in the figure below, where the figure of merit (FOM) is calculated from 10, 35, and finally to 50GHz. The MHD algorithm requires a MATLAB license, but WRT also accommodates customer data as another option, where WRT provides the comparison between measured and simulated data. Additional Resources If you are attending DesignCon 2025 , be sure to stop by Cadence booth 827 to see WRT’s CMP-70 advanced channel modeling solution in action with the Clarity 3D Solver. Check out our on-demand webinar, " Validating Clarity 3D Solver Accuracy Through Measurement Correlation ." Learn more about the CMP-70 solution and the Clarity 3D Solver . For more information about Cadence’s full suite of integrated multiphysics simulation solutions, download our Multiphysics System Analysis Solutions Portfolio .

Allegro X System Capture offers a complete ecosystem for library development. This post introduces the latest DE-HDL Library Development using System Capture course in which you learn how to create different library objects. As a librarian, you often work with numerous libraries. Your tasks include creating or modifying symbols for libraries. To use Allegro X System Capture to create a library, you can follow the steps in the following flowchart: Let’s go through each step in detail. Setting the CDS_SITE Variable Before you start library development for a new project, set the CDS_SITE system environment variable. This step is required to access libraries and other configuration files. Creating a Project in Allegro X System Capture The next step is to create a project in Allegro X System Capture. Adding a Library to the Project Symbol development consists of creating symbol graphics, electrical data, and properties used by different tools in the PCB design flow. To add a library to a project, first create a library in the Libraries pane of the Project e xplorer. Creating Library Symbols The library development process supports the creation of various types of symbols. Creating a Symbol with Multiple Views You can generate multiple views of the same symbol using the Duplicate command. For example, a discrete symbol, such as a resistor, can have multiple views, as shown in the following image: Creating a Split Symbol For advanced designs, you often need to create library symbols and break them into multiple sections to support the design process. When a symbol shows all the logical pins in the physical package, it is called a single-section or flat symbol. Many large ICs have several pins and the symbols need to fit on a single schematic page. One workaround is to use vector pin names on a symbol to reduce its size, although manufacturers prefer schematics that show each pin. You can divide these high-pin count devices into smaller pieces, where each piece is a separate version of the part. Such parts are referred to as split parts or multi-section symbols. For multi-section symbols, you can create two types of split parts—symmetrical and asymmetrical. Symmetrical Split Symbols A symmetrical split symbol has only one symbol graphic, which holds two or more identical logic symbols, each with its own unique physical pin numbers. You can create a symmetrical split symbol using the Duplicate Section icon in the canvas window. Each symbol section contains the same set of pins but different pin numbers, as shown in the following image: Asymmetrical Split Symbols An asymmetrical split symbol is a symbol whose physical package contains one or more unique schematic symbols. You can create an asymmetrical split symbol by clicking the New Section icon in the canvas window. Asymmetrical symbols have a unique set of logical pins, as shown in the following image: Creating Symbols Using the Spreadsheet Interface To simplify the development of large symbols, Allegro X System Capture has a Spreadsheet Interface . You can copy from a spreadsheet into the interface. This saves time and helps minimize errors introduced by manual entry. In conclusion, the DE-HDL library development using Allegro X System Capture course involves several critical steps and supports various symbol creation techniques. This course helps librarians create and modify symbols effortlessly and deepens their understanding of library development within Allegro X System Capture. To learn more about this topic, enroll in the DE-HDL Library Development using Allegro X System Capture course on the Cadence Support portal . Click the training byte link now or visit Cadence Support and search for training bytes under Video Library. If you find the post useful and want to delve deeper into training details, enroll in the following online training course for lab instructions and a downloadable design: DE-HDL Library Development using Allegro X System Capture (Online). You can become Cadence Certified once you complete the course. Cadence Training Services now offers free Digital Badges for all popular online training courses. These badges indicate proficiency in a certain technology or skill and give you a way to validate your expertise to managers and potential employers. You can add the digital badge to your email signature or any social media channels, such as Facebook or LinkedIn, to highlight your expertise. To find out more, see the blog post Take a Cadence Masterclass and Get a Badge . You might also be interested in the training Learning Map that guides you through recommended course flows as well as tool experience and knowledge-level training modules. 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As a verification engineer, you’re surely looking for ways to automate the debugging process. Have you developed your own scripts to ease specific debugging steps that tools don’t offer? Working with scripts locally and manually is challenging—so is reusing and organizing them. What if there was a way to create your own app with the required functionality and register it with the tool? The answer to that question is “Yes!” The Verisium Debug Python App Store lets you instantly add additional features and capabilities to your Verisium Debug Application using Python Apps that interact with Verisium Debug via the Python API. Join me, Principal Education Application Engineer Bhairava Prasad, for this Training Webinar and discover the Verisium Debug Python App Store. The app store allows you to search for existing apps, learn about them, install or uninstall them, and even customize existing apps. Date and Time Wednesday, November 20, 2024 07:00 PST San Jose / 10:00 EST New York / 15:00 GMT London / 16:00 CET Munich / 17:00 IST Jerusalem / 20:30 IST Bangalore / 23:00 CST Beijing REGISTER To register for this webinar, sign in with your Cadence Support account (email ID and password) to log in to the Learning and Support System*. Then select Enroll to register for the session. Once registered, you’ll receive a confirmation email containing all login details. A quick reminder: If you haven’t received a registration confirmation within one hour of registering, please check your spam folder and ensure your pop-up blockers are off and cookies are enabled. For issues with registration or other inquiries, reach out to eur_training_webinars@cadence.com . Like this topic? Take this opportunity and register for the free online course related to this webinar topic: Verisium Debug Training To view our complete training offerings, visit the Cadence Training website Want to share this and other great Cadence learning opportunities with someone else? Tell them to subscribe . Hungry for Training? Choose the Cadence Training Menu that’s right for you. Related Courses Xcelium Simulator Training Course | Cadence Related Blogs Unveiling the Capabilities of Verisium Manager for Optimized Operations - Verification - Cadence Blogs - Cadence Community Verisium SimAI: SoC Verification with Unprecedented Coverage Maximization - Corporate News - Cadence Blogs - Cadence Community Verisium SimAI: Maximizing Coverage, Minimizing Bugs, Unlocking Peak Throughput - Verification - Cadence Blogs - Cadence Community Related Training Bytes Introducing Verisium Debug (Video) (cadence.com) Introduction to UVM Debug of Verisium Debug (Video) (cadence.com) Verisium Debug Customized Apps with Python API Please see course learning maps a visual representation of courses and course relationships. Regional course catalogs may be viewed here . *If you don’t have a Cadence Support account, go to Cadence User Registration and complete the requested information. Or visit Registration Help .

This year, the Cadence Giving Foundation (CGF) launched Fem.AI to achieve a more inclusive tech sector, and the inaugural Fem.AI Summit that took place on October 1 was a luminary in a world where technology is evolving at an unprecedented pace. The summit not only excelled in its mission to enlighten, empower, and mobilize stakeholders across various industries on the issue of gender disparity in high tech and AI, but was a celebration of innovation, diversity, and empowerment. As we reflect on the moments that made the summit unforgettable, it's clear that the event was more than just a meeting of minds—it was a movement for change! Shaping Tomorrow Together Cadence’s president and CEO, Anirudh Devgan, stated, “Women’s talent and perspectives are crucial to shaping the future of AI.” Devgan’s words epitomized the driving force behind the first-ever Fem.AI Summit which brought together innovators, educators, business leadership, and investors across industries to create an ecosystem that ensures women can fully participate in the AI revolution and burgeoning AI economy. The energy of pioneers ready to collectively disrupt the status quo filled the air, and as the day-long summit began, it became clear that we were part of something truly groundbreaking. The event's lineup of speakers held discussions that went beyond the technical aspects of AI, emphasizing the vital importance of diversity in technology. Such insights were lent by leading voices from MIT, Stanford, and UC Berkeley, who set the stage for inspiring discussions with speakers like Dr. Joy Buolamwini, Founder of the Algorithmic Justice League, and Reshma Saujani, Founder and CEO of Moms First and Girls Who Code. Included in this lineup of leading figures was Dr. Chelsea Clinton, Vice Chair of the Clinton Foundation, who left us with her hopes for the future of women in AI: “I’m hoping because of company-wide commitments like what we’re experiencing here today thanks to Cadence, that the people who will be part of designing [future technologies] will have a different group of people around the proverbial table or the computer screens doing that… and that women will be more integral into the conceptualization and then the actualization of AI-driven enterprises.” The hopes and visions for women in AI cannot manifest in a vacuum, they must be achieved with the support of individuals and systems from education all the way to the upper echelons of leadership. It is with this understanding, that Fem.AI is committed to investing in women at every stage of their STEM journey. Breaking Barriers It is with this ideal that we were honored to hear from women breaking through barriers of gender, race, and class in achieving pinnacles of success in areas of science and technology. Dr. Sarah H. Chen, Postdoctoral Researcher at Stanford and Thriving Stars Scholar at MIT, Niki Karanikola, Machine Learning Engineer and Break Through Tech AI Scholar at MIT, and Katya Echazarreta, NASA’s first Mexican Astronaut, showcased the resilience and determination that drive progress within and beyond our industry. Through their stories of persevering despite all odds, we were reminded that supporting students in STEM can create generational change with impacts beyond the realms of AI and technology. The final speaker at the Cadence Fem.AI Summit, the trailblazing Brandi Chastain, Founder of Bay FC, World Cup Champion, and Olympic Gold Medalist, left us with a powerful reminder that when faced with this opportunity: “Our purpose needs to be intentional” especially in building the future of technology and AI where “diversity is not something to be afraid of, but something to be embraced.” Echoing this sentiment, summit attendees left the event reminded of the crucial role we collectively play in ensuring women are part of this tech revolution. Moving Forward While the summit may have concluded, its impact will continue through individuals, companies, and communities aspiring to achieve an equitable tech sector. This is just the start, and we must take collective action now. We hope that you will join Cadence to ensure that we clear the path and catalyze women's role in the AI revolution! Meet Our Partners Our partners are making Fem.AI’s vision a reality through their important work advancing women in technology, including fostering STEM excellence in higher education, launching STEM careers, and achieving gender diversity in leadership. Learn more about the important work of each of our partners by visiting their pages: Break Through Tech Last Mile Education Fund Fast Forward Generation VC Include Global Semiconductor Alliance Join the Fem.AI Alliance Joining the Fem.AI Alliance signals that your company or institution is committed to evolving the AI workforce. By increasing the representation of women in AI, we aim to broaden the talent pool and the perspective so that AI represents us all. Through the Fem.AI Alliance, companies and institutions can share best practices, guidance, and inspiration. Since its launch, companies like the Equinix Foundation, NetApp, NVIDIA, Unity Technologies, and Workday have joined the Alliance in their commitment to Fem.AI’s work and mission. Visit Fem.AI to get involved today or contact Fem.AI@cadence.com .

DDR5 DIMM Architectures The DDR5 generation of Double Data Rate DRAM memories has experienced rapid adoption in recent years. In particular, the JEDEC-defined DDR5 Dual Inline Memory Module (DIMM) cards have become a mainstay for systems looking for high-density, high-bandwidth, off-chip random access memory[1]. Within a short time, the DIMM architecture evolved from an interconnected hierarchy of only SDRAM memory devices (UDIMM[2]) to complex subsystems of interconnected components (RDIMM/LRDIMM/MRDIMM[3]). DIMM Designs and Popular Verification Use Cases The growing complexity of the DIMMs presented a challenge for pre-silicon verification engineers who could no longer simply validate against single DDR5 SDRAM memory models. They needed to consider how their designs would perform against DIMMs connected to each channel and operating at gigahertz clock speeds. To address this verification gap, Cadence developed DDR5 DIMM Memory Models that encapsulated all of the architectural complexities presented by real-world DIMMs based on a robust, easy-to-use, easy-to-debug, and easy-to-reconfigure methodology. This memory-subsystem-in-a-single-instance model has seen explosive adoption among the traditional IP Developer and SOC Integrator customers of Cadence Memory Models. The Cadence DIMM models act as a single unit with all of the relevant DIMM components instantiated and interconnected within, and with all AC/Timing parameters among the various components fully matched out-of-the-box, based on JEDEC specifications as well as datasheets of actual devices in the market. The typical use-case for the DIMM models has been where the DUT is a DDR5 Memory Controller + PHY IP stack, and the validation plan mandated compliance with the JEDEC standards and Memory Device vendor datasheets. Unique Use Case for the DIMM Discrete Component Models Although the Cadence DIMM models have enjoyed tremendous proliferation because of their cohesive implementation and unified user API, the actual DIMM Models are built on top of powerful, flexible discrete component models, each of which was designed to stand on its own as a complete SystemVerilog UVM-based VIP. All of these discrete component models exist in the Cadence VIP Catalog as standalone VIPs, complete with their own protocol compliance checking capabilities and their own configuration mappings comprehensively modeling individual AC/Timing parameters. Because of this deliberate design decision, the Cadence DIMM Discrete Component Models can support a unique use-case scenario. Some users seek to develop IC Designs for the various DIMM components. Such users need verification environments that can model the individual components of a DIMM and allow them the option to replace one or another component with their Component Design IP. They can then validate that their component design is fully compatible with the rest of the components on the DIMM and meets the integrity of the overall DIMM compliance with JEDEC standards or Memory Vendor datasheets. The Cadence Memory VIP portfolio today includes various examples that demonstrate how customers can create DIMM “wrappers” by selecting from among the available DIMM discrete component models and “stitching” them together to build their own custom testbench around their specific Component Design IP. A Solution for Unique Component Scenarios The Cadence DDR5 DIMM Memory Models and DIMM Discrete Component Models can provide users with a flexible approach to validating their specific component designs with a fully populated pre-silicon environment. Augmented Verification Capabilities When the DIMM “wrapper” model is augmented with the Cadence DFI VIP[4] that can simulate an MC+PHY stack and offers a SystemVerilog UVM test API to the verification engineer, the overall testbench transforms into a formidable pre-silicon validation vehicle. The DFI VIP is designed as a combination of an independent DFI MC VIP and a DFI PHY VIP connected to each other via the DFI Standard Interface and capable of operating seamlessly as a single unit. It presents a UVM Sequence API to the user into the DFI MC VIP with the Memory Interface of the PHY VIP connected to the DIMM “wrapper” model. With this testbench in hand, the user can then fully take advantage of the UVM Sequence Library that comes with the DFI VIP to enable deep validation of their Component Design inside the DIMM “wrapper” model. Verification Capabilities Further Enhanced A possible further enhancement comes with the potential addition of an instance of the Cadence DIMM Memory Model in a Passive Monitor mode at the DRAM Memory Interface. The DIMM Passive Monitor consumes the same configuration describing the DIMM “wrapper” in the testbench, and thus can act as a reference model for the DIMM wrapper. If the DIMM Passive Monitor responds successfully to accesses from the DFI VIP, but the DIMM wrapper does not, then it exposes potential bugs in the DUT Components or in the settings of their AC/Timing parameters inside the DIMM wrapper. Debuggability, Interface Visibility, and Protocol Compliance One of the key benefits of the DIMM Discrete Component Models that become manifest, whether in terms of the unique use-case scenario described here, or when working with the wholly unified DDR5 DIMM Memory Models, is the increased debuggability of the protocol functionality. The intentional separation of the discrete components of a DIMM allows the user to have full visibility of the memory traffic at every datapath landmark within a DIMM structure. For example, in modeling an LRDIMM or MRDIMM, the interface between the RCD component and the SDRAM components, the interface between the RCD component and the DB components, and the interface between the SDRAM components and the DB components—all are visible and accessible to the user. The user has full access to dump the values and states of the wire interconnects at these interfaces to the waveform viewer and thus can observe and correlate the activity against any protocol violations flagged in the trace logs by any one or more of the DIMM Discrete Component Models. Access to these interfaces is freely available when using the DIMM Discrete Component Models. On the unified DDR5 DIMM Memory Models, a feature called Debug Ports enables the same level of visibility into the individual interconnects amidst the SDRAM components, RCD components, and DB components. When combined with the Waveform Debugger[5] capability that comes built-in with the VIPs and Memory Models offered by Cadence and used with the Cadence Verisium Debug[6] tool, the enhanced debuggability becomes a powerful platform. With these debug accesses enabled, the user can pull out transaction streams, chip state and bank state streams, mode register streams, and error message streams all right next to their RTL signals in the same Verisium Debug waveform viewer window to debug failures all in one place. The Verisium Debug tool also parses all of the log files to probe and extract messages into a fully integrated Smart Log in a tabbed window fully hyperlinked to the waveform viewer, all at your fingertips. A Solution for Every Scenario Cadence's DDR5 DIMM Memory Models and DIMM Discrete Component Models , partnered with the Cadence DFI VIP, can provide users with a robust and flexible approach to validating their designs thoroughly and effectively in pre-silicon verification environments ahead of tapeout commitments. The solution offers unparalleled latitude in debuggability when the Debug Ports and Waveform Debugger functions of the Memory Models are switched on and boosted with the use of the Cadence Verisium Debug tool. [1] Shyam Sharma, DDR5 DIMM Design and Verification Considerations , 13 Jan 2023. [2] Shyam Sharma, DDR5 UDIMM Evolution to Clock Buffered DIMMs (CUDIMM) , 23 Sep 2024. [3] Kos Gitchev, DDR5 12.8Gbps MRDIMM IP: Powering the Future of AI, HPC, and Data Centers , 26 Aug 2024. [4] Chetan Shingala and Salehabibi Shaikh, How to Verify JEDEC DRAM Memory Controller, PHY, or Memory Device? , 29 Mar 2022. [5] Rahul Jha, Cadence Memory Models - The Gold Standard , 15 Apr 2024. [6] Manisha Pradhan, Accelerate Design Debugging Using Verisium Debug , 11 Jul 2023.