At a bustling Cadence event, we met Adrian, an intern at a startup who immerses himself in Cadence tools for his research and work.

Adrian was enthusiastic about the innovative technologies at his disposal but faced a significant challenge: internet access was limited to a single machine for new joiners, forcing interns to wait in line for their turn to use online resources.

Adrian's excitement soared when he discovered a game-changing solution: Doc Assistant. The cloud-based help viewer, Doc Assistant, ships with all Cadence tools, enabling Adrian to access help resources offline from any machine equipped with the software. This meant Adrian could continue his research and work seamlessly, irrespective of internet availability!

Meeting Cadence users and customers at such events has given us the opportunity to showcase how they can benefit from the diverse features that Doc Assistant offers.

With that note, welcome back to our Doc Assistant A-Z blog series! In Part 1, we explored key features and benefits that our innovative viewer brings to the table. Today, in Part 2, we'll dive deeper into the advanced functionalities and customization options that make Doc Assistant indispensable for its users.

Whether you're looking to streamline your workflow or enhance your user experience, this blog will provide the insights you need to fully leverage the capabilities of our documentation viewer. Let’s get started!

What Makes Doc Assistant Stand Out?

Here are a few (more) cool features of Doc Assistant!

That's not all. We have more coming your way. Until next time, take care and stay tuned for our next edition!

Want to Know More?

For any questions or general feedback, write to docassistant.support@cadence.com.

Subscribe to receive email notifications about our latest Custom IC Design blog posts.

Happy reading!

-Priya Sriram, on behalf of the Doc Assistant Team

Read this blog to know more about the innovation behind Universal Connect Modules (UCM).(read more)

Welcome back to the Doc Assistant A-Z blog series!

Since the launch of Doc Assistant, we've been gathering feedback and input from our customers regarding their experiences with our latest documentation viewer. My interaction with Ralf was particularly useful and interesting.

Ralf is a design engineer who works on complex schematics and intricate layouts. For each release, he is challenged with the task of verifying the tool and feature changes across multiple releases. He shared with me that he has been using Doc Assistant’s capabilities to help him achieve this.

Ralf explained that he utilizes Doc Assistant to open and compare documents from different releases side-by-side, seamlessly tracking updates across multiple releases and verifying those updates in his Cadence tools. Additionally, in Doc Assistant’s online mode, he compares documents across previous tool versions, ensuring a thorough review of any changes. Finally, he was happy to share with me that Doc Assistant features have helped him significantly reduce the time he spends on identifying such changes.

You, of course, can also achieve such productivity gains using several Doc Assistant features designed to help simplify such tasks!

In previous editions of this blog series, we looked at some key features and benefits of Doc Assistant. If you've missed these editions, I would highly recommend that you read them:

• Doc Assistant A-Z: Making the Most of the Cadence Cloud-Based Help Viewer: Part 1
• Doc Assistant A-Z: Making the Most of the Cadence Cloud-Based Help Viewer: Part 2
  

In this third installment, we're diving into some more of Doc Assistant's key capabilities.

To learn more about how to use the above features, check out the Doc Assistant User Guide.

These are just a few of the productivity gain features in Doc Assistant. We’ll cover more in the next blog in the series.

Want to Know More?

If you have any feedback on Doc Assistant or would like to request more information or a demo, please contact docassistant.support@cadence.com.

Subscribe to receive email notifications about our latest Custom IC Design blog posts.

Happy reading!

- Priya Sriram, on behalf of the Doc Assistant Team

Hello Fellow PCB Designers,

We have a 10 layer PCB design that originated in Pads and was converted over to Allegro 17.4, this is an old design but is manufacturable and works perfectly fine.  When I try to generate a Gerber for the Top or Bottom layers

the Gerber comes out fine.  But Most of the middle layers are Etch's and via's for power and grounds, but the Gerber's come mostly blank, there might be some details, but in the Gerber view everything is displayed correctly.

The design does have many close spacings, I have not changed anything in the constrains manager yet, turned off a lot of the DRC's, but thinking there might be something wrong with the constrains.

  I find that the CSet is set to 2_18, not sure yet what this means, also there are many of these definitions, PCS 3,4,5,ect, are the same as CSet 2_18 any suggestions would be great, we are currently looking into this, have seen

that even small change in constraint manager can cause long processing and even Allegro crashing, this is a large project.

Thanks Much, Thanks, Mike Pollock.

Hi All

I am looking for the functions which are different about OrCAD Professional and Allegro tier.

is there any resource?

regard

Hello,

A mybe silly question came to my mind: When routing sense lines, is it better to hav them as close as possible to DUT or afer the decoupling capacitors ?

Force in red, sense in purple.

Best way is 1 or 2 ?

Thanks in advance and Merry Christmas to everybody !

Hi,

I found that under the Dark Theme of PCB Environment Editor 17.4,

the window background is not all dark, resulting in unclear text display。

As shown in the figure below：

Hi

In the environment I'm currently working, axes are shown for schematic, symbol, and layout views.For schematics and symbols, I'd prefer a dim gray, such that the axes are just visible but not dominant. For the layout, I'd prefer a brighter color. Is there a way to realize this? So far when I change the color of the 'axis' layer in the display resource editor, the axes in all three views get changed together:

Thanks very much for your input!

Dear all,

I defined two design variables in ADE Assembler, say V1 and V2, that define the voltage 1 and voltage 2 of a "vpulse" voltage source in my schematic.

Then, I define V1 = 1.0, and V2 = 2.0, run a transient simulation, and everything is as expexcted. The source provides pulses between 1.0 V and 2.0 V.

Next, I set V1 = 1.0:0.5:1.5, thereby creating a parametric sweep with 1.0 V and 1.5 V for V1. I keep V2 at 2.0 V. Then the simulation fails, and all I get is "netl err" in my Output Expressions and an error message that the results directory does not exist and nothing can be plotted: This is reasonable, as the results directory is deleted on starting a new simulation, and as there is no simulation result, none of my output expressions can be plotted.

WARNING (OCN-6040): The specified directory does not exist, or the directory does not contain valid PSF results.
        Ensure that the path to the directory is correct and the directory has a logFile and PSF result files.
WARNING (ADE-1065): No simulation results are available.
ERROR (WIA-1175): Cannot plot waveform signals because no waveform data is available for plotting.
One of the possible reasons can be that 'Save' check box for these signals are not selected in the Outputs Setup pane. Ensure that these check boxes are selected before you run the simulation.

Normally, this kind of para,metric sweep is not a problem, I have done this many times before. There must be something special in THIS PARTICULAR test bench or simulator setup. The trouble is, I don't get any useful error messages.

Does anyone know what might be the problem here OR where to find useful information to investigate further (log files stored somewhere)? Thank you!

Regards,

Volker

P.S. Using Corners instead does not help either. Running it through all values by hand works, though.

Hi, 

When I try to run Monte Carlo it gives me a 3 items message for possible failure:

1. It says the machine selected in the current job setup policy isnot reachable

2. The Cadence hierarchy is not detected, not installed properly. or

3. Job start script (with a path and a name like swiftNetlistService#) is not found on the remote machines.

Any recommendation on how to fix this?

Hello Everybody

Recently, I want to design a high output Power Amplifier at 2.4GHz using TSMC 1P6M CMOS Bulk Process. I use its nmos_rf_25_6t transistor model to determine the approximate mosfet size

I use the most common Common-Source Differential Amplifier topology with neutralizing capacitor to improve its stability and power gain performance

Because I want to output large power, the size of mosfet is very large, the gate width is about 2mm, when I perform harmonic balance analysis, everything is alright, the OP1dB is about 28dBm (0.63Watt)

But When I perform Transient simulation, the magnitude of voltage and current waveform at the saturation point is too small, for voltgae, Vpeaking is about 50mV, for current, Ipeaking is about 5mA

I assume some reasons: the bsim4 model is not complete/ the virtuoso version is wrong (My virtuoso version is IC6.1.7-64b.500.21)/the spectre version is wrong (spectre version is 15.1.0 32bit)/the MMSIM version is wrong/Transient Simulation setting is wrong (the algorithm is select gear2only, but when I select other, like: trap, the results have no difference), the maxstep I set 5ps, minstep I set 2ps to improve simulation speed, I think this step is much smaller than the fundamental period (1/2.4e9≈416ps)

I have no idea how to solve this problem, please help me! Thank you very very much!

Hello everyone, 
I have a testbench for generating s2p files from a SP simulation that was working until few months ago. Today I have reopened (w/o making changes that I am aware of) and I get the error as shown below:

first I show the testbench settings:

notice how the s2p generation is disabled: the field "file" is left blank

in the corner I defined some parameters, "filename" is the word that is suppose to generate the name for the s2p. 

where the two variables are defined as follows

And now the output log:

spectre.out file gives the following error:


When clicking on the error message at "9", the input.scs file opens up and the line 9 gets highlighted in green



now, so far I understood that the problem seem to be related tom the "pathcds" variable, but I really don't understand what the error message here means, since I don't see any error in the input.scs file

by the way - if for instance I define the variable "filename" as shown below, then I get no errors:

thanks
Tommaso

Hello everyone,

I hope you're all doing well. I’ve set up two testbenches (TB1 and TB2) for my Design Under Test (DUT) using Cadence IC6.1.8-64b.500.21 tools, as shown in the attached figure. The DUT has multiple views available: schematic, Calibre, Maestro, and Symbol, and each testbench uses the same DUT in different scenarios. Currently, I have to manually switch between these views, but I would like to streamline this process.

My goal is to use a single config view that allows me to switch between the schematic and the extracted (Calibre) views. Ideally, I would like to have a configuration file where making changes once would update both testbenches (TB1 and TB2) automatically. In other words, when I modify one config, both testbenches should reflect this update for a single simulation run.

I would really appreciate it if you could guide me on the following:

1. How to create a config view for my DUT that can be used to easily switch between the schematic and extracted views, impacting both TB1 and TB2.
2. Where to specify view priorities or other settings to control which view is used during simulation.
3. Best practices for using a config file in this scenario, so that it ensures consistency across multiple testbenches.

Please refer to the attached figure to get a better understanding of the setup I’m using, where both TB1 and TB2 include the same DUT with multiple available views.

Thank you so much for your time and assistance!

When analyzing multiple sessions simultaneously Verisium Manager crashed and reported below error messages:

# A fatal error has been detected by the Java Runtime Environment:
#
#  SIGSEGV (0xb) at pc=0x00007efc52861b74, pid=14182, tid=18380
#
# JRE version: OpenJDK Runtime Environment Temurin-17.0.3+7 (17.0.3+7) (build 17.0.3+7)
# Java VM: OpenJDK 64-Bit Server VM Temurin-17.0.3+7 (17.0.3+7, mixed mode, sharing, tiered, compressed oops, compressed class ptrs, g1 gc, linux-amd64)
# Problematic frame:
# C  [libucis.so+0x238b74]

......

For more details please refer to the attached log file "hs_err_pid21143.log".

Two approaches were tried to solve this problem but neither has worked.
Method.1:

Setting larger heap size of Java process by "-memlimit" options.For example "vmanager -memlimit 8G".

Method.2:

Enlarging stack memory size limit of the Coverage engine by setting "IMC_NATIVE_STACKSIZE" environment variable to a larger value. For example "setenv IMC_NATIVE_STACKSIZE 1024000"

According to "hs_err_pid*.log" it is almost certain that the memory overflow triggered Java's CrashOnOutOfMemoryError and caused Verisium Manager to crash. There are some arguments about memory management of Java like "Xms, Xmx, ThreadStackSize, Xss5048k etc" and maybe this problem can be fixed by setting these arguments during analysis. However, how exactly does Verisium Manager specify these arguments during analysis? I tried to set them by the form of setting environment variables before analysis but it didn't work in analysis and their values didn't change.

Is there something wrong with my operation or is there a better solution?

Thank you very much.

I'm working on the code coverage. Doing a metrics analysis by default we see overall average grade and overall covered. But when i do a block analysis on an instance i see overall covered grade, code covered grade, block covered grade, statement covered grade, expression covered grade, toggle covered grade.

As I dont know the difference I started to read the IMC user guide and came to know there are 3 things we come across while doing a code coverage local, covered, average

From my understanding

local - child instances metrics doesnt reach the parent level. For example, we have an instance Q and its sub instances like Q.a, Q.b. Block Local grade of Q can be 100% even when its instances Q.a and Q.b a block local grades isnt at 100%.

In the attached image there is formula 

The key difference between average and covered is the weights.

Average : Mathematically taking the above scenario where Q.a, and Q.b has 10 blocks each. Q.a has covered 8 blocks and q.b has covered 2 blocks. Now if we take the normal average it should be total covered/ totatl number = 8+2/10+10 yielding 50%. But when we add weights saying Q.a is 70% and Q.b is 30% the new number would be (8*0.7+2*0.3) / (10*0.7+10*0.3) resulting 62%. Because of the weights we see 12% bump.

Covered: there is no role of weights.

Among these 3 metrics i've changed my default view to this in the image to get more realistic picture when i do analyze metrics. Do you guys agree with the approach?

We are trying to run compilation, elab and sim with command xrun -r -u alu, where alu is one of the units to execute. we are getting the following errors.

1) xmsim: *E,DLMKDF: Unable to add default DEFINE std       /home/xxxx/Cad/xcelium/tools/inca/files/STD.
    xmsim: *E,DLMKDF: Unable to add default DEFINE synopsys  /home/xxxx/Cad/xcelium/tools/inca/files/SYNOPSYS

2) xmsim: *W,DLNOHV: Unable to find an 'hdl.var' file to load in.

What is the purpose of hdl.var

3) xmsim: *F,NOSNAP: Snapshot 'alu' does not exist in the libraries.

I cannot see in log files, which libraries is it referring to??

Any one request you to help on how to debug these.

I have been using the rank feature to identify tests that are redundant in our environment, but then I realized I'd also like to be able to see exactly what coverage goes into increasing the delta_cov value for a given test. If I had a test in my rank report that contributed 0.5% of the delta_cov, how could I got about seeing exactly where that 0.5% was coming from? It seems like that might be part of the correlate function, but I couldn't mange to find a way to see what specific coverage was being contributed for a given test.

The two macros below introduce new syntax for adding definitions to more than one 'when' determinant value at the same time. The first macro overloads 'extend' keyword and the second is the equivalent for 'when' keyword.

A use example:

extend [HUGE, BIG] packet {
    // definitions that pertain to these subtypes
};

The above code would be expanded in the following (naive) way:

extend HUGE packet {
    // definitions that pertain to these subtypes
};
extend BIG packet {
    // definitions that pertain to these subtypes
};


The macros code:

define 'statement>
       "extend ['name>,...] 'name> ({;...})" as computed {
    for each in 'names> do {
        result = appendf("%sextend %s %s %s;",result,it,'name>,);
    };
    result = appendf("{%s}",result); // required only for versions 6.1.1 or earlier
};

define 'struct_member>
       "when ['name>,...] 'name> ({;...})" as computed {
    for each in 'names> do {
        result = appendf("%swhen %s %s %s;",result,it,'name>,);
    };
    result = appendf("{%s}",result); // required only for versions 6.1.1 or earlier
};

I've heard lots of people asking for a way to generate Makefiles for Specman code, and it seems there are some who don't use "irun" which takes care of this automatically. So I wrote this little utility to build a basic Makefile based on the compiled and loaded e code.

It's really easy to use: at any time load the snmakedeps.e into Specman, and use "write makefile <name> [-ignore_test]".
This will dump a Makefile with a set of variables corresponding to the loaded packages, and targets to build any compiled modules.
Using -ignore_test will avoid having the test file in the Makefile, in case you switch tests often (who doesn't?).

It also writes a stub target so you can do "make stub_ncvlog" or "make stub vhdl" etc.

The targets are pretty basic, I thought it was more useful to #include this into the main Makefile and define your own more complex targets / dependencies as required.

The package uses the "reflection" facility of the e language, which is now documented since Specman 8.1, so you can extend this utility if you want (please share any enhancements you make).

 Enjoy! :-)

Steve.

As noted in white papers, posts on the Team Specman Blog, and the Specman documentation, IntelliGen is a totally new stimulus generator than the original "Pgen" and, as a result, there is some amount of effort needed to migrate an existing verification environment to fully leverage the power of IntelliGen.  One of the main steps in migrating code is running the linters on your code and adressing the issues highlighted. 

Included below is a simple utility you can include in your environment that allows you to collect some valuable statistics about your code base to allow you to better gauge the amount of work that might be required to migrate from Pgen to IntelliGen.  The ICFS statistics reported are of particular benefit as the utility not only identifies the approximate number of ICFSs in the environment, it also breaks the total number down according to generation contexts (structs/units and gen-on-the-fly statements) allowing you to better focus your migration efforts. 

IMPORTANT: Sometimes a given environment can trigger a large number of IntelliGen linting messages right off the bat.  Don't let this freak you out!  This does not mean that migration will be a long effort as quite often some slight changes to an environment remove a large number of identified issues.  I recently encountered a situation where a simple change to three locations in the environment, removed 500+ ICFSs!

The methods included in the utility can be used to report information on the following:
- Number of e modules
- Number of lines in the environment (including blanks and comments)
- Number and type of IntelliGen Guidelines linting messages
- Number of Inconsistently Connected Field Sets (ICFSs)
- Number of ICFS contexts and how many ICFSs per context
- Number of soft..select overlays found in the envioronment
- Number of Laces identified in the environment

To use the code below, simply load it before/after loading e-code and then
you can execute any of the following methods:

- sys.print_file_stats()             : prints # of lines and files
- sys.print_constraint_stats()   : prints # of constraints in the environment
- sys.print_guideline_stats()    : prints # of each type of linting message
- sys.print_icfs_stats()            : prints # of ICFSs, contexts and #ICFS/context
- sys.print_soft_select_stats() : prints # of soft select overlay issues
- sys.print_lace_stats()           : *Only works for SPMNv6.2s4 and later* prints # of laces identified in the environment

Each of the above calls to methods produces it's own log files (stored in the current working directory) containing relevant information for more detailed analysis.
- file_stats_log.elog : Output of "show modules" command
- constraint_log.elog : Output of the "show constraint" command
- guidelines_log.elog : Output of "gen lint -g" (with notification set to MAX_INT in order to get all warnings)
- icfs_log.elog       : Output of "gen lint -i" command
- soft_select_log.elog: Output of the "gen lint -s" command
- lace_log.elog       : Output of the "show lace" command

Happy generating!

Corey Goss

Join this insightful on-demand webinar event "SI/PI Simulation and Measurement Correlation Forum" available through Signal Integrity Journal that features industry expert presentations ranging from chip to package to complex board designs.(read more)

Using the EMX solver, X-FAB design engineers can efficiently develop next-generation RF technology for the latest communication standards (including sub-6GHz 5G, mmWave, UWB, etc.), which are enabling technologies for communications and electric vehicle (EV) wireless applications. (read more)

RF Design Solutions for Next-Generation Products The International Microwave Symposium (IMS2022), otherwise known as Microwave Week, was recently held (June 19-24) at the Denver Convention center, returning to its long-standing g...(read more)

Melika Roshandell talks with David Malinak in a Microwaves & RF QuickChat video about the thermal challenges in today’s complex electronic designs and how the Celsius solver uniquely addresses them.(read more)

With the latest release (Sigrity and Systems Analysis 2022.1 HF2) of Clarity  3D Solver, support for encrypted component models is now available. With this functionality, vendors that supply 3D components, such as connectors, can now merge their...(read more)

If you have seen any images or demonstrations of the 17.4-2019 release, the GUI may look ...(read more)

Cadence Clarity 3D Solver supports encrypted component models! Using this functionality, vendors can supply their 3D components, such as connectors, to end customers without revealing the physical IP of these designs. The first connector vendor to take advantage of this functionality is Japan Aviation Electronics (JAE),(read more)

The silkscreen layer plays a crucial role in the assembly, repair, and testing of a PCB. You can add a variety of information to this layer, such as the location of the components, polarity, component orientation, on-off switches, LEDs, and testpoint...(read more)

Microwaves & RF's David Maliniak interviews Sherry Hess of Cadence about recently announced products of Optimality and OnCloud.(read more)

A constraint is a user-defined property, or a rule, applied to a physical object, such as a net, pin, or via in a design. There are a number of constraints that can be applied to an object based on its type and behavior. For example, you can define t...(read more)

Hi, newbie here.

We are using AWR Design Enviroment in our university and so I have to install it (OS: Arch Linux)
I installed it in a Windows 10 VM without problems.

When I try to start it prompts "Failed to connect to license server", I guess thats the first problem.

After that when trying to generate my SUL License it will prompt Internal Error -8 (see Image)

I can't find something on Error -8 :/ and overall the available data to the license topic is quit low :/

If someone has a solution for that I would gladly hear about it :)

Hi,
My Virtuoso and Spectre Version: ICADVM20.1-64b.NYISR30.2
I plot an eye diagram using a built in function. I want to see the data-dependent jitter. I want to measure the eye diagram edges at zero crossing (width of that diamond part) shown in the pic by vertical and horizontal markers. I can put a marker and read the numbers there and get what I want. But now I want to run Monte Carlo and I can't do this for all samples. I wish I could write an expression for this. Unfortunately, I see that the function "cross" is not working on the eye diagram. Basically, when I send the eye diagram data to a table, I see that it actually is just the prbs data and not the eye diagram data. Is there a hack that can help me achieve my goal which is: having an expression to measure the edges of the eye diagram at zero crossing?
There is a script that Andrew wrote (https://support.cadence.com/wps/mypoc/cos?uri=deeplinkmin%3AViewSolution%3BsolutionNumber%3D11395772). This is a good script but it puts all edges on top of each other. I want to distinguish the two edges. In the attached pic (two-period eye diagram) you can see what I mean by the two edges (diamond shapes). I want to measure each of the two and take the maximum. Having all the edges on top of each other won't give me what I want. All edges together will lso include DCD. I purely want to measure DDJ. DCD is measured separately. I have very little experience with writing scripts and could not modify Andrew's script.
Your help is much appreciated. Thank you.

Hi *,

I am simulating a 32kHz high Q crystal oscillator with a pulse shaping circuit. I set up a PSS analysis using the Shooting Newton engine. I set a beat frequency of 32k and used the crystal output and ground as reference nodes. After the initial transient the amplitude growth was already pretty much settled such that the shooting iterations could continue the job.

My problem is: In 5...10% of my PVT runs the simulator detects a frequency divider in the initial transient simulation. The output log says:

Frequency divided by 3 at node <xxx>

The Estimated oscillating frequency from Tstab Tran is = 11.0193 kHz .

However, the mentioned node is only part of the control logic and is always constant (but it has some ripples and glitches which are all less than 30uV). These glitches spoil my fundamental frequency (11kHz instead of 32kHz). Sometimes the simulator detects a frequency division by 2 or 3 and the mentioned node <xxx> is different depending on PVT - but the node is always a genuine high or low signal inside my control logic.

How can I tell the simulator that there is no frequency divider and it should only observe the given node pair in the PSS analysis setup to estimate the fundamental frequency? I have tried the following workarounds but none of them worked reliably:

- extended/reduced the initial transient simulation time

- decreased accuracy

- preset override with Euler integration method for the initial transient to damp glitches

- tried different initial conditions

- specified various oscillator nodes in the analysis setup form

By the way, I am using Spectre X (version 21.1.0.389.ISR8) with CX accuracy.

Thanks for your support and best regards

Stephan

I get multiple results at the same frequency in a 3-tone simulation.

I try to determine the IP3 of a mixer. I have 3 large signal tones: 0.75 GHz, 1.25 GHz and 1.26 GHz.

At the IM3 frequency of 490 MHz I observe 4 results, see also the screenshot of the table output. The frequencies are exactly the same (even when I subtract 490 MHz by using xval() ).

Which of the values do I have to use to determine the correct IP3?

Is there an option to merge these results?

While adding an element created from a netlist file in AWR, I am getting the error 'The element type being dropped is not compatible with the window it is being dropped into'. The netlist file in AWR has the following contents:

.subckt BFG520W base collector emitter npn
.model BFG520W NPN(IS=1.016E-15 NF=1.000 BF=220.1 IKF=510E-3 VAF=48.06
+ ISE=2.83E-13 NE=2.035 NR=0.988 BR=100.7 IKR=2.352E-3
+ VAR=1.692 ISC=24.48E-18 NC=1.022 RB=10.00 RE=0.7753
+ RC=2.21 CJC=447.6E-15 MJC=0.07 VJC=0.1892
+ CJE=1.245E-12 TF=8.616E-12 TR=5.437E-12 mfg=NXP)

I have attached screenshots of the element BFG520W2 created due to the above netlist and the error I am getting while adding this element.

Hello Everybody

Recently, I want to design a high output Power Amplifier at 2.4GHz using TSMC 1P6M CMOS Bulk Process. I use its nmos_rf_25_6t transistor model to determine the approximate mosfet size

I use the most common Common-Source Differential Amplifier topology with neutralizing capacitor to improve its stability and power gain performance

Because I want to output large power, the size of mosfet is very large, the gate width is about 2mm, when I perform harmonic balance analysis, everything is alright, the OP1dB is about 28dBm (0.63Watt)

But When I perform Transient simulation, the magnitude of voltage and current waveform at the saturation point is too small, for voltgae, Vpeaking is about 50mV, for current, Ipeaking is about 5mA

I assume some reasons: the bsim4 model is not complete/ the virtuoso version is wrong (My virtuoso version is IC6.1.7-64b.500.21)/the spectre version is wrong (spectre version is 15.1.0 32bit)/the MMSIM version is wrong/Transient Simulation setting is wrong (the algorithm is select gear2only, but when I select other, like: trap, the results have no difference), the maxstep I set 5ps, minstep I set 2ps to improve simulation speed, I think this step is much smaller than the fundamental period (1/2.4e9≈416ps)

I have no idea how to solve this problem, please help me! Thank you very very much!

Sample clues

18 across: Makoto Hagiwara and David Jung both claim to have invented it (7,6)

1 down: French impressionist who rejected that term (5)

3 down: Artificial surface used for playing hockey (9)

7 down: The sequel to Iliad (7)

12 down: Adipose tissue (4,3)

Extrowords © 2007 IndiaUncut.com. All rights reserved.
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Sample clues

6 across: Franchise revived by Frank Miller (6)

13 across: What Keanu Reeves and Zayed Khan have in common (5)

18 across: What Frank Sinatra and George Clooney have in common (6,6)

19 across: Dosa mix, for example (6)

2 down: Green, in a non-environmental way (7)

Extrowords © 2007 IndiaUncut.com. All rights reserved.
India Uncut * The IU Blog * Rave Out * Extrowords * Workoutable * Linkastic

Sample clues

5 down: Torso covering (6)

7 down: Government by rogues (12)

15 across: eBay speciality (7)

18 across: Demonic (8)

20 across: Common language (6,6)

Extrowords © 2007 IndiaUncut.com. All rights reserved.
India Uncut * The IU Blog * Rave Out * Extrowords * Workoutable * Linkastic

Sample clues

17 across: Beckham speciality (4,4)

4 down: Havana speciality (5)

19 across: Infamous 1988 commercial against Michael Dukakis (9,4)

11 down: Precisely (2,3,3)

13 down: City infamously ransacked by the Japanese in 1937 (7)

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Sample clues

11 across: Chandigarh’s is 0172 (3,4)

21 across: He’s a loser, baby (4)

1 down: Garment meant to shape the torso (6)

12 down: It’s slogan: “Life, Liberty and the Pursuit” (8)

18 down: Noise made by badminton players? (6)

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Sample clues

5 across: The US president’s bird (3,5,3)

11 down: Group once known as the Quarrymen (7)

10 across: Cavalry sword (5)

19 across: Masonic ritual (5,6)

1 down: Pioneer of Ostpolitik (6)

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Sample clues

14 across: FDR’s baby (3,4)

1 down: A glitch in the Matrix? (4,2)

4 down: Slanted character (6)

5 down: New Year’s venue in New York (5,6)

16 down: Atmosphere of melancholy (5)

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Sample clues

6 across: Alejandro González Iñárritu’s breakthrough film (6,6)

19 across: Soft leather shoe (8)

7 down: Randroids, for example (12)

12 down: First American World Chess Champion (7)

17 down: Circle of influence (5)

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Sample clues

5 across: Robbie Robertson song about Richard Manuel (6,5)

2 down: F5 on a keyboard (7)

10 across: Lionel Richie hit (5)

3 down: ALTAIR, for example (5)

16 down: The problem with Florida 2000 (5)

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Sample clues

9 across: Van Morrison classic from Moondance (7)

6 down: Order beginning with ‘A’ (12)

6 across: Fatal weakness (8,4)

19 across: Rolling Stones classic (12)

4 down: Massacre tool (8)

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